RENO PMT TEST Kyung Ju Ma 2007 Oct

RENO PMT TEST Kyung Ju Ma, 2007. Oct. 6 RENO Collaboration meeting Ø ü ü Ø PMT type DAQ setup Single Photon Electron Resolution Dark Current After Pulse Ratio with two methods Summary

8” and 10” PMTs Hamamatsu R 5912 Signal from XP 1806 Photonis XP 1806 Hamamatsu R 7081

DAQ SETUP R 5912, XP 1806 -data taking Hp pulse/function generator 8116 A PMT set with ice water & Dark Box 100 Mhz, FADC Module(shaped)

Single Photon Electron Resolution Ø Clear single photon electron peak R 7081 116 [m. V] 61. 5 [m. V] ※ qtot ∝ Charge of SPE Peak-to-Valley gain SPE charge [p. C] R 5912 ~4 ~107 (1300 V) 24. 0 Xp 1806 ~4 ~107 (1550 V) 12. 3

Gain dependence of temperature Temp. . [o. C] Mean Error[±] 2. 9 1. 21 x 102 1. 50 14. 3 1. 16× 102 0. 98 24. 5 1. 14× 102 2. 32

Dark Current Temperature Dependence(R 5912) Ø RENO expected Dark Current at 10 ~ 15 o. C is ~ 6 K/s Ø 6~10 K/s are measured for the expected region which are more higher than expected. Ø For the steep increase at 14 ~ 15 o. C, the spent time after closed dark Box having been considered.

Dark Current Temperature Dependence(R 7081) Ø linear dependence Øshow 8 K/s for the region of 10 ~15 o. C Ø more higher than R 5912 and XP 1806

Dark Current Temperature Dependence(XP 1806) Ø linear dependence Ø show 2 ~ 3 K/s for the region of around 10 o. C

After Pulse Ratio using accumulated Method(R 5912) Ø First After Pulse Ratio = 1. 88 % Ø Second After Pulse Ratio= 3. 65 %

After Pulse Ratio using accumulated Method(XP 1806) Ø First After Pulse Ratio =3. 26 % Ø Second After Pulse Ratio=2. 47 %

After Pulse Ratio using accumulated Method(R 7081) Ø First After Pulse Ratio =2. 57 % Ø Second After Pulse Ratio=2. 91 %

Probability (No. of SPE /0. 1. micro. sec. ) Pulse Ratio using clustering Method(R 5912) 0. 7 micro. Sec. 1. 7 micro. Sec. 6. 7 micro. Sec. ⅹ 10 ns Ø After Pulse Ratio = 2. 6 ~3. 9 % Ø After Pulse peaks are occurred after 0. 7, 1. 7 and 6. 7 micro second. (Primary signal region (1300, 1360)

Probability (No. of SPE /0. 1. micro. sec. ) Pulse Ratio using clustering Method(xp 1806) 1. 2 micro. Sec. ⅹ 10 ns 6. 7 micro. Sec. Ø After Pulse peaks are occurred after 1. 2 and 6. 7 micro second. (Primary signal region (1310, 1350)

Probability (No. of SPE /0. 1. micro. sec. ) Pulse Ratio using clustering Method(R 7081) 0. 7 micro. Sec. 6. 7 micro. Sec. ⅹ 10 ns Ø After Pulse Ratio = 2. 1 ~2. 6 % Ø After Pulse peaks are occurred after 0. 7 and 6. 7 micro second. (Primary signal region (1010, 1050)

After Pulse Ratio using the clustering Method Ø Both PMT show 2 ~ 3 % which is correspond to the PMT specification Ø After Pulse don’t show temperature dependence. it has been known and convinced

SUMMARY Ø Tested PMT: Hamamatsu PMT(8 inch-R 5912, 10 inch-R 7081), Photonis PMT(8 inch XP 1806) Ø DAQ setup: 100 Hz FADC, PMT set with ICE water, 10 ns width Pulse generator Ø R 5912, r 7081 show the clear single photon electron resolution. Ø Gain and Dark Current show the temperature dependence. Ø Dark Currents are 6~10 K/s(R 5912), 8 K/s(R 7081), 2~3 K/s(XP 1806) for the temp. range(10~15 o. C) Ø After Pulse Ratio(APR) was tested using two method (Accumulating, Clustering ). - APR by Clustering Method for R 5912, XP 1806 and R 7081 show 2 ~ 3 % which is correspond to the PMT specification - APR by Accumulated metod for R 5912, XP 1806 and R 7081 show 5 ~5. 7 % which is correspond to the PMT specification Ø R 5912, XP 1806 and R 7081 have typical After Pulse shape as show fixed After Pulse time region after Primary Signal. Ø After Pulse don’t show temperature dependence.

NEXT STEP Ø XP 1806 base noise problem fix and single photo electron resolution study. Ø Dark Current dependence on Spending time (after Dark Box closing, after HV turn on) and temperature. Ø study about the different result for After Pulse Ratio by Accumulated method and Clustering method.