KM 3 Ne T PMTs PMT tubes PMT
KM 3 Ne. T PMT’s PMT tubes PMT bases PMT asic’s Automatic G. Kieft Nikhef Amsterda m Electronics Technol ogy tester for PMT bases Camac test set-up for PMT tubes Le. Croy test set-up for PMT modules Future testing of many PMT modules in parallel? 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 1
PMT tubes Currently PMT tubes from 3 manufacturers: ETEL, Hamamatsu and HZC-Photonics Different PMT types per manufacturer Different pinning diameter and layout of the pins Different High Voltage division between pins In principle one PMT base design sufficient for all PMT types Only G. Kieft Nikhef Amsterda m Electronics Technol ogy minor schematics adjustments to adjust for HV division But different PCB layout due to different pin layout Base PCB layout is very critical due to minimal space KM 3 Ne. T Collaboration Meeting and HV 30 Januari 2013 Marseille 2
ETEL Hamamatsu G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 3
Hamamatsu PMT’s for PPMDU One DOM of PPM-DU uses Hamamatsu PMT R 12199 -02 is probably not the final type No special PMT base PMT R 12199 -02 will be produced 33 ETEL bases are modified for Hamamatsu R 1219902 G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 4
Hamamatsu PMT for KM 3 Ne. T Phase 1 Current pin layout is a problem for PCB layout of the base Hamamatsu is requested to change the pin layout Start PCB layout of unique Hamamatsu base is pending G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 5
PMT PCB layout very critical due to minimal space and HV G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 6
Block diagram of PMT PROMi. S Co. Co G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 7
Specifications of High Voltage circuit HV circuit, • • • Low ripple • 706 m. V 1056 8. 5 < T(°C) < 22. 1 • 0. 07% 8. 5 < T(°C) < 22. 1 • Voltage stabilization 0. 95% on 38% input variation Vripple < 150 m. V/dynode Low power • Vinput 3. 3 V • . 6 - 1. 4 m. A 3 v 3 at 700 - 1500 V < 4. 5 m. W (commercial available 50 m. W) Low RFI • • G. Kieft Nikhef Amsterda m Electronics Technol ogy cathode voltage -700 till -1500 V Small foot print • d. V/dt < 75 m. V/µs, RFI -20 d. B @ 150 k. Hz-10 MHz Adjustable HV • • for 10 dynodes PMT PCB = 38 - 42 mm Ø Amplifier charge input: 160 f. C (corresponds with 1 pe and PMT gain of 1 x 10^6) 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 8
ETEL PMT D 783 FLA base with PROMi. S_v 2 and Co. Co_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy Co. Co 30 Januari 2013 PROMi. S KM 3 Ne. T Collaboration Meeting Marseille 9
PROMi. S_v 2 and Co. Co_v 2 asic’s G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 10
Block diagram of Co. Co_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 11
Specifications of Co. Co_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 12
Block diagram of PROMi. S_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 13
Specifications of the PROMi. S_v 2 A front end ASIC for the readout of the PMT in the KM 3 Ne. T detector – D. Gajanana et. al. http: //iopscience. iop. org/1748 -0221/5/12/C 12040/ G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 14
Preliminary costs estimation of PROMi. S_v 2 and Co. Co_v 2 PROMi. S_v 2 Quantity MPW run Total costs Unit Price 210 € 8, 200 € 39. 05 50, 000 € 95, 000 € 1. 90 Low volume run 350, 000 € 110, 000 € 0. 32 Total € 213, 200 € 0. 54 Engineering run 400, 210 Co. Co_v 2 Quantity MPW run G. Kieft Nikhef Amsterda m Electronics Technol ogy Total costs Unit Price 210 € 8, 200 € 39. 05 50, 000 € 145, 000 € 2. 90 Low volume run 350, 000 € 115, 000 € 0. 33 Total € 268, 200 € 0. 67 Engineering run 400, 210 30 Januari 2013 € 50, 000 for test handler! KM 3 Ne. T Collaboration Meeting Marseille 15
Automatic tester for PMT bases Depending G. Kieft Nikhef Amsterda m Electronics Technol ogy on final size of KM 3 Ne. T up to around 400, 000 PMT bases have to be produced and tested For this big volume production the bases have to be tested during production by the assembling company(ies) Automatic test set-up is being designed suitable to be placed at and operated by assembling company Test program in Lab. View will indicate a pass or fail when the base is tested. In case of a fail, the program will pinpoint to the area on the base causing the failure Removable mechanical adapters for different type of Collaboration Meeting PMT bases 30 Januari 2013 KM 3 Ne. T Marseille 16
Mechanical overview of tester FPGA board with USB interface to PC G. Kieft Nikhef Amsterda m Electronics Technol ogy HV measurement unit (Mezzanine) PMT base to be tested PMT Base adapter set with contact pins Mother board 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 17
Principle of mechanical PMT base adapter G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 18
Motherboard with mezzanine and adapter connectors G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 19
PCB layout of HV measurement units G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 20
HV barrier Safety system PMT base adapter PMT base PMT Tail Adapter Voltage Adjustment and Current measurement Pr o Co. Co Pr mi o PROMIS s mi s HV measurement supply unit 1 CW High Voltage circuit HV barrier HV measurement supply unit 14 Test PROMIS outputs Digital value PROMIS outputs Co. Co test frequentie and pulswidth Digital values frequentie ad pulswidth Control Board Electronics for charge inject PROMIS Digital value for charge adjust Test HV Control And I 2 C Digital value HV control G. Kieft Nikhef Amsterda m Electronics Technol ogy Discharge capacitors from CW high voltage circuit Digital value of inter dynode voltages 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 21
PMT base tester FPGA board G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 22
Camac set-up to test PMT tubes G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 23
Block diagram of Camac test setup G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 24
Le. Croy test set-up for PMT’s with base Counter Pulse generator Light Source Trigger Lemo Pseudo Octopus board To. T signal G. Kieft Nikhef Amsterda m Electronics Technol ogy USB Driver NI 30 Januari 2013 I 2 C Control KM 3 Ne. T Collaboration Meeting Marseille Dark Box 25
Le. Croy measurements G. Kieft Nikhef Amsterda m Electronics Technol ogy 1. Set HV of PMT at value for gain of 5 x 10^6 2. Without light, measure dark count frequency (<2 KHz) 3. Make histogram of dark count To. T 4. Set pulse oscillator at 100 KHz 5. Set amplitude of pulse oscillator such that frequency on counter is: darkcount + 10 KHz. Amount of light from light source is now a single photon 6. Trigger Le. Croy on pulse generator and make histogram of To. T (small peak at 31 ns) 7. Make histogram of time between trigger and KM 3 Ne. T Collaboration Meeting rising edge of To. T signal. This gives the TTS 26 30 Januari 2013 Marseille
Future testing of many PMT’s with base in parallel ? Depending G. Kieft Nikhef Amsterda m Electronics Technol ogy on the yield only test samples of PMT tubes (PMT tubes are already tested by manufacturer) Test all PMT bases before soldering on PMT tube Preferable and if possible have PMT bases produced, tested and soldered on PMT by PMT manufacturer Test all PMT’s with base before DOM assembly Because of high volume testing of PMT’s with base must be done in parallel (long time required in dark box to get quiet) Possibly make use of DOM electronics with electrical interface to test PC (test 31 PMT’s with base in parallel) Need to find institute to develop test set-up !!! 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 27
Summary Every G. Kieft Nikhef Amsterda m Electronics Technol ogy PMT type needs a unique PMT base PCB layout of PMT base is critical due to space and HV Layout PMT base(s) for KM 3 Ne. T phase 1 still to design PROMi. S and Co. Co asic’s are ready for large production PMT base tester is being developed to enable testing during assembly by company New test set-up needed to test many PMT’s with base in parallel Need to find institute to work on development of KM 3 Ne. T Collaboration Meeting this test set-up 30 Januari 2013 Marseille 28
Thank you !!! G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 29
Questions ? G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 30
Backup Sheets G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 31
Specifications of Co. Co_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy Min Typ Max VDDD 3. 0 V 3. 3 V 3. 6 V IDDD 0. 2 m. A 1 m. A 2 m. A SW 500 Hz 50 k. Hz 60 k. Hz Frequency depends on the capacitor connected to CF (PIN 1) SW 200 ns 6. 5 us 7. 5 us CSNS 80 m. V 100 m. V 200 m. V 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 32
Co. Co – Cockroft Walton Feedback Control Circuit Pin out and chip schematics G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 33
Co. Co_v 2 Bonding Diagram G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 34
Specifications of the PROMi. S_v 2 Time resolution : 2 ns (Photon arrival time accuracy) Time-over-Threshold : 1 pe → 25 ns (1 E 6 e-). . 10 pe → 350 ns (8000000 e-) LVDS signaling. Analog Output buffer (see next slide). I 2 C slow control. Comparator threshold adjustment: 0. 8 V – 2. 4 V Resolution : 8 bits (bin size = 6. 25 m. V) Reference voltages for High Voltage circuit: 1. 9 V … 2. 7 V (resolution 8 bits)→ High Voltage: -700 V …-1500 V G. Kieft Nikhef Amsterda m Electronics Technol ogy Power consumption : ~ 20 m. W Technology: 0. 35μm CMOS (Austria. Micro. Systems) Immunity to dirty Power supplies Immunity to voltage breakdowns originated in the PMT 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 35
Clk_enable (12) VDDD(13) Global_reset (14) GNDD(14) Anabuf+(15) Anabuf-(16) Layout PROMi. S_v 2 Bondpad name (package pin number) LVDS-(1) SCL(11) LVDS+(2) GNDD(3) SDA(10) 1. 25 mm PDIO(9) Pptrim_busy (open) 30 Januari 2013 HVDAC(8) 1. 7 mm VDDA(7) GNDA(6) G. Kieft Nikhef Amsterda m Electronics Technol ogy Preamp(5) Vthr(4) KM 3 Ne. T Collaboration Meeting Marseille 36
PROMi. S_v 2 Bonding Diagram G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 37
Analog signal output of PROMi. S_v 2 G. Kieft Nikhef Amsterda m Electronics Technol ogy 30 Januari 2013 KM 3 Ne. T Collaboration Meeting Marseille 38
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