MS LG XS PXL ladder tests at IPHC

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Preliminary Ladder Testing Results At IPHC MS, XS, LG 1 1 1

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Outline Ladders Testing Goals Voltage, power and temperature on ladder Baseline comparisons to probe test results Sensor performance in ladder configuration Issues What we have learned? Future testing l l l l 2 2 2

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Ladders 3 l Thin and thick sensor ladders. l Large bypass caps at either end, no small bypass caps (pads area available for VDDA, VDDD, VCLP). l Hand assembled quickly from probe tested sensors that function but have not been extensively characterized and are not necessarily optimum. l Tested at LBNL for JTAG function, test mode line pattern, normal mode readout was checked for proper header pattern. Ladders were then shipped to IPHC. l Probe system used primarily test modes. Normal RDO mode implemented(mostly) at IPHC. 3 3

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Testing goals l Validate the cable design – Cable design driven by l mechanical requirements l Test results from Phase-1 sensor ladders l Expected large power consumption at startup – – Basic funcitonality (JTAG, Power distribution, etc. ) Characterization of sensor performance l Test mode l Normal readout mode l As a function of bypass capacitance 4 4 4

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Voltage, power and temperature on ladder 5 5 5

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Voltage, power and temperature on ladder Thin Sensor Cable HIGH threshold settings LOW threshold settings One sensor @ regulator 3. 97 3. 5 GND on the cable 67 m. V 73 m. V 12 m. V Sensor power 3. 583 3. 546 3. 448 Driver power 3. 471 3. 467 3. 48 GND 153 m. V 170 m. V 23 m. V Power 3. 478 3. 427 3. 435 End of ladder power 3. 459 3. 406 3. 433 End of ladder GND 172 m. V 190 m. V 23 m. V One sensor Driver section Begin low mass section 6 6 Thin Sensor Cable HIGH threshold settings Beginning of ladder 3. 325 LOW threshold settings 3. 257 End of ladder 3. 287 3. 216 n. a. Thick Sensor Cable HIGH threshold settings One sensor Beginning of ladder 3. 256 LOW threshold settings 3. 172 End of ladder 3. 213 3. 122 n. a. 6

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Voltage, power and temperature on ladder Cooling liquid @ 22. 5 °C 7 7 7

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Baseline comparisons to probe test results l No damage during shipping – l JTAG and basic functionality Sensor damage during construction: – – 1 sensor on the “thick” ladder (L 1) 2 senosrs on the “thin” ladder (L 2) l We 8 8 suspect VCLP failure – to be tested later 8

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Baseline comparisons to probe test results 9 9 9

MS, LG, XS 10 10 PXL ladder tests at IPHC, May 1 -7, 2012

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Sensor performance in ladder configuration 11 11 11

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Issues: threshold shift 12 12 12

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Issues: self-induced noise 13 13 5× -1 m. V -2 m. V A 60 60 11. 5 k B 95 1. 3 k 1. 9 M C 0. 5 k 3. 7 k 64 k D 1. 5 k 10. 0 k 0. 2 M 13

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Issues: missing header/trailer bits 14 14 14

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 What we have learned? 15 l We need to work on our probe testing to be sure that we are getting good results. l We need to be more careful of ESD during ladder construction. l The voltage drop on the ladders appears to be manageable. l The threshold baseline shifts with applied VDD and noise. l Self induced sensor noise is possible. l The noise observed without any bypassing capacitors in the sensor array is significant. l Additional testing is needed 15 15

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Future testing l l l 16 Add bypass capacitors Retest existing ladders In parallel, design split-power cable Assemble split-power ladder in Berkeley Continue intensive testing at LBL 16 16

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Discussion points 17 l Additional measurments l An onboard regulator may help with the threshold shifts and with noise immunity, but at the cost of power dissipation l … 17 17

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Back up slides 18 18 18

MS, LG, XS PXL ladder tests at IPHC, May 1 -7, 2012 Issues: ladder induced noise 19 19 19