EE 365 Readonly memories Static readwrite memories Dynamic

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EE 365 Read-only memories Static read/write memories Dynamic read/write memories 1

EE 365 Read-only memories Static read/write memories Dynamic read/write memories 1

Read-Only Memories • Program storage – Boot ROM for personal computers – Complete application

Read-Only Memories • Program storage – Boot ROM for personal computers – Complete application storage for embedded systems. 2

A 4 x 4 Multiplier (using AND gates and full-adders) Maximum Delay path 3

A 4 x 4 Multiplier (using AND gates and full-adders) Maximum Delay path 3

A 4 x 4 multiplier using a 256 x 8 ROM Use a C-program

A 4 x 4 multiplier using a 256 x 8 ROM Use a C-program to generate this table 4

diagram of a 8 x 4 diode And. Logic you have a 4 x

diagram of a 8 x 4 diode And. Logic you have a 4 x 4 multiplier that will be. ROM real fast For a 4 x 4 multiplier replace the 3 -to-8 decoder by a 8 -to-256 decoder Sounds scary? We will see much larger circuits later Add 8 vertical lines to output And then add a number of diodes at some of the intersection points using the table generated earlier 5

Two-dimensional decoding 128 x 1 ROM 6

Two-dimensional decoding 128 x 1 ROM 6

Mos Transistors as Storage elements 7

Mos Transistors as Storage elements 7

Larger example, 32 Kx 8 ROM 8

Larger example, 32 Kx 8 ROM 8

Typical commercial EEPROMs 9

Typical commercial EEPROMs 9

Microprocessor EPROM application 10

Microprocessor EPROM application 10

ROM control and I/O signals 11

ROM control and I/O signals 11

ROM timing 12

ROM timing 12

Read/Write Memories • a. k. a. “RAM” (Random Access Memory) • Volatility – Most

Read/Write Memories • a. k. a. “RAM” (Random Access Memory) • Volatility – Most RAMs lose their memory when power is removed – NVRAM = RAM + battery – Or use EEPROM • SRAM (Static RAM) – Memory behaves like latches or flip-flops • DRAM (Dynamic Memory) – Memory lasts only for a few milliseconds – Must “refresh” locations by reading or writing 13

SRAM 14

SRAM 14

SRAM operation • Individual bits are D latches, not edge-triggered D flip-flops. – Fewer

SRAM operation • Individual bits are D latches, not edge-triggered D flip-flops. – Fewer transistors per cell. • Implications for write operations: – Address must be stable before writing cell. – Data must be stable before ending a write. 15

SRAM array 16

SRAM array 16

SRAM control lines • Chip select • Output enable • Write enable 17

SRAM control lines • Chip select • Output enable • Write enable 17

SRAM read timing • Similar to ROM read timing 18

SRAM read timing • Similar to ROM read timing 18

SRAM write timing • Address must be stable before and after write-enable is asserted.

SRAM write timing • Address must be stable before and after write-enable is asserted. • Data is latched on trailing edge of (WE & CS). 19

Bidirectional data in and out pins • Use the same data pins for reads

Bidirectional data in and out pins • Use the same data pins for reads and writes – Especially common on wide devices – Makes sense when used with microprocessor buses (also bidirectional) 20

SRAM devices • Similar to ROM packages 28 -pin DIPs 32 -pin DIPs 21

SRAM devices • Similar to ROM packages 28 -pin DIPs 32 -pin DIPs 21

Synchronous SRAMs • Use latch-type SRAM cells internally • Put registers in front of

Synchronous SRAMs • Use latch-type SRAM cells internally • Put registers in front of address and control (and maybe data) for easier interfacing with synchronous systems at high speeds • E. g. , Pentium cache RAMs 22

DRAM (Dynamic RAMs) • SRAMs typically use six transistors per bit of storage. •

DRAM (Dynamic RAMs) • SRAMs typically use six transistors per bit of storage. • DRAMs use only one transistor per bit: • 1/0 = capacitor charged/discharged 23

DRAM read operations – Precharge bit line to VDD/2. – Take the word line

DRAM read operations – Precharge bit line to VDD/2. – Take the word line HIGH. – Detect whether current flows into or out of the cell. – Note: cell contents are destroyed by the read! – Must write the bit value back after reading. 24

DRAM write operations – Take the word line HIGH. – Set the bit line

DRAM write operations – Take the word line HIGH. – Set the bit line LOW or HIGH to store 0 or 1. – Take the word line LOW. – Note: The stored charge for a 1 will eventually leak off. 25

DRAM charge leakage • Typical devices require each cell to be refreshed once every

DRAM charge leakage • Typical devices require each cell to be refreshed once every 4 to 64 m. S. • During “suspended” operation, notebook computers use power mainly for DRAM refresh. 26

DRAM-chip internal organization 64 K x 1 DRAM 27

DRAM-chip internal organization 64 K x 1 DRAM 27

RAS/CAS operation • Row Address Strobe, Column Address Strobe – n address bits are

RAS/CAS operation • Row Address Strobe, Column Address Strobe – n address bits are provided in two steps using n/2 pins, referenced to the falling edges of RAS_L and CAS_L – Traditional method of DRAM operation for 20 years. – Now being supplanted by synchronous, clocked interfaces in SDRAM (synchronous DRAM). 28

DRAM read timing 29

DRAM read timing 29

DRAM refresh timing 30

DRAM refresh timing 30

DRAM write timing 31

DRAM write timing 31