The XRay SEF Scott Speakman 13 4009 A

The X-Ray SEF Scott Speakman 13 -4009 A x 3 -6887 speakman@mit. edu

What Can You Do with XRD? Identify and Quantify Phase Composition Ti. O 2 - Rutile Ti. O 2 - Anatase Ti. O 2 - Brookite Rutile: P 42/mnm high temperature polymorph white pigment, sunscreen, UV-blocking coatings, photovoltaic Anatase: I 41/amd semiconductor, photocatalyst, antimicrobial coating, oxygen sensor Brookite: Pcab no known use

Other Things to Do with XRD Data § Measure Unit Cell Lattice Parameters § Estimate Crystallite Size and Microstrain § Measure Residual Stress (macrostrain) § Measure Texture or Epitaxy § Evaluate Thin Film Quality § Determine Crystal Orientation § Determine Crystal Structure

Diffraction Techniques Available at the CMSE § X-Ray Powder Diffraction (XRPD) § § § § § Grazing Incidence Angle Diffraction (GIXD) Pole Figure Mapping Microdiffraction (m. XRD) Residual Stress Mapping In situ XRD Reciprocal Space Mapping Single Crystal Diffraction (SCD) Back-Reflection Laue X-Ray Reflectivity (XRR) Small Angle X-Ray Scattering (SAXS)

Rigaku Powder Diffractometer § Fast, precision XRPD § High-power rotating anode source

Bruker D 8 with GADDS Large 2 D detector for simultaneous collection of diffraction data over a 2 theta and chi (tilt) ranges as large as 30°

m. XRD with the D 8

PANalytical X’Pert Pro MPD Prefix optics allow the configuration to be quickly changed to accommodate a wide variety of data collection strategies.

Mix `n` Match Incident-Side Göbel Mirror Sample Stage 15 -position automated sample changer Eularian Cradle Computer. Controlled Divergence Slit High-temperature furnace Cryostat Receiving-Side Coarse parallel beam collimator w/ point detector Fine parallel beam collimator w/ point detector High-speed detector (w/ or w/o monochromator)

Reconfigurable in Minutes High-speed in situ XRD High-accuracy parallel-beam XRD

Bede D 3 Triple Axis Diffractometer High resolution measurements with extensive beam conditioning optics for thin film analysis Rocking Curve XRR

Bruker SMART APEX A 2 D CCD detector fast, high precision transmission diffraction through small single crystals.

SAXS § The beam path length of 60. 4 cm allows the resolution of crystallographic and structural features on a length scale from 1. 8 nm to 40 nm (1. 8 nm is near the maximum resolvable length scale for XRPD in our other systems). § high-power rotating anode X-ray source § two-dimensional detector for real-time data collection

Upcoming Sessions § Jan 18 - 2 -4 pm- Nanocrystallite Size Analysis using XRD § Jan 25 - 2 -4 pm- The Wonders of X-Ray Diffraction § Training for New Users § XRD Lab Orientation & Safety: Jan 31, 1: 30 to 3 pm § Instruction for Novice Users: Jan 31, 3 to 5 pm § Instruction for Experienced Users: Feb 2, 2 to 4 pm