UAC proposal Nanoscale Measurements of Imaging Devices Prof

UAC proposal Nanoscale Measurements of Imaging Devices Prof. Shefford Baker Department of Materials Science and Engineering Cornell University Liang-Bih Lin Xerographic Component Systems Group 1 April 21, 2010 Cornel MSE For Internal Use Only

Defects in Intermediate Transfer Belts and Other Xerographic Components • Most xerographic components are consisted of nanoparticles/microparticles and polymeric binder. • Many print defects are known to associated with the additives and dispersion quality. Mechanical properties and structural integrity can also fall through the cracks if the additive/dispersion not handled properly. 2 April 21, 2010 Cornel MSE For Internal Use Only

Proposed Activities • Investigate deformation dynamics and microstructure defects of intermediate transfer belts, imaging and charging members using various state-of-the-art nanoscale and microscale measuring techniques: - Substrate Curvature Stress Measurement System - Scanning Nanoindenter - X-ray Microtensile Tester - X-ray Thermal Strain Measurement System - Other Facilities at Cornell University, including equipment available at the Cornell Center for Materials Research (CCMR), the Cornell Nanofabrication Facility (CNF), and the Cornell High Energy Synchrotron Source (CHESS) 3 April 21, 2010 Cornel MSE For Internal Use Only

Thermomechanical Testing Differential thermal expansion leads to stresses, strains Substrate Curvature Measurements X-ray Measurements 2 q R y metal film tf ts (331) (111) (331) substrate • Measure d(sin 2 y ) • Calculate in-plane strain • Measure curvature • Calculate stresses 2 æ E ö ts s =ç ÷ è 1 - n øs 6 Rt f 4 April 21, 2010 si = Cijej Cornel MSE For Internal Use Only

Graded Driver Film Method Cr thickness gradient Sample Cr Cr film Linear shutter Cu Substrate 0. 01 -0. 1 mm/s Advantage: • low T process chemistry. Evaporation source maintains original interface • No extra bonding layer deformation no extraneous • Integrated testing geometry in one test. all information • Easy to control crack initiation. • 2 -D mapping of adhesion vs. interface chemistry high throughput approach. 5 April 21, 2010 Cornel MSE For Internal Use Only

Scanning Nanoindenter P h High resolution nanoindentation Topography imaging 6 April 21, 2010 Cornel MSE Record load and displacement during indentation Knowledge of contact area with depth Apply to soft materials. Dynamic contact measurements For Internal Use Only

Relevance to Xerox • Many of our xerographic components are consisted of nanoparticles and microparticles in a certain polymeric binder, i. e. they are nanocomposites in nature. • One of the major issues often found in developing and manufacturing of those devices is the lack of structural integrity and inconsistent electrical and mechanical properties. • For many of our products, identifying a good guiding principle on additive types, resin types, and dispersion quality would be extremely beneficial. 7 April 21, 2010 Cornel MSE For Internal Use Only

Background of Investigators and Institution Prof. Baker is well known for his seminar work on mechanical properties of materials having microstructural or dimensional length scales in the nanometer regime. His research work can be divided into two broad areas: thin films and nanopatterned structures and nanocontact measurements. • B. M. (Music) University of New Mexico 1982 • Ph. D Stanford University 1993 Some facts about the university: • Cornell's 2005– 06 research expenditures totaled $605. 3 million • Cornell ranked first in National Science Foundation funding for programs in academic science and engineering in 2003– 04 • Forty Nobel laureates have been affiliated with Cornell as faculty members or students. In 2005– 06, Cornell received 237 invention disclosures, licensed 47 inventions to industry, and helped form five start-up companies that are based on Cornell technologies. 8 April 21, 2010 Cornel MSE For Internal Use Only

Role of Xerox Liaison Manager • Interact with Prof. Baker and his colleagues on xerographic components research. • Share with Prof. Baker his expertise on xerography and photoconductive and semiconductive devices and provide guidance on identifying key approaches to studying structural integrity and related device qualities. • Hold regular meetings between the two groups to discuss research progress. • Identify relevant scientific findings for applications to Xerox’s own technology. 9 April 21, 2010 Cornel MSE For Internal Use Only

Finances and Timetable • The requested funding is $20, 000 per year for three years. The funding is specifically targeted for graduate student stipend. The proposed timetable is the following. • 1 st and 2 nd years: Study microstructure and deformation dynamics of imaging members, intermediate transfer members, and charging members. • 3 rd year: Develop a (chemical) model in the relationship between microstructure of additive and binder resin and their mechanical properties. 10 April 21, 2010 Cornel MSE For Internal Use Only