This is powder diffraction Peter J La Puma

D 8 DISCOVER WITH GADDS n Powders n Speed n Texture n Versatility n

2 -D Single crystal data Peter J. La. Puma 5 © 1998 BRUKER AXS,

2 -D Texture data Peter J. La. Puma 9 © 1998 BRUKER AXS, Inc.

$General Area Detector Diffraction Solution n 2 -D position sensitive detector n Collects data$

Point detector vs. area detector Peter J. La. Puma 13 © 1998 BRUKER AXS,

Point detector vs. area detector Peter J. La. Puma 14 © 1998 BRUKER AXS,

Point detector vs. area detector Peter J. La. Puma 15 © 1998 BRUKER AXS,

Point detector vs. area detector Peter J. La. Puma 16 © 1998 BRUKER AXS,

D 8 DISCOVER with GADDS n Real and useable intensity data from preferentially oriented

$D 8 Discover with GADDS - Applications n Powder diffraction n Texture n Stress$

Basic Configuration - Beam Path Peter J. La. Puma 19 © 1998 BRUKER AXS,

D 8 DISCOVER with GADDS Basic Configuration Peter J. La. Puma 20 © 1998

$Powder Diffraction n Analyze 70 deg. of 2 theta without moving the detector n$

$Powder diffraction - Analysis n Advanced phase identification with to PDF database n Quantitative$

Texture analysis a) b) c) Peter J. La. Puma 23 © 1998 BRUKER AXS,

Texture analysis - Speed n Simultaneous measurement of single crystal, textured and untextured materials

Texture data analysis n User friendly analysis software for pole figure representation n 3

D 8 DISCOVER with GADDS all purpose configuration Peter J. La. Puma 26 ©

Residual stress analysis does not occur in 1 -D Peter J. La. Puma 27

Residual stress analysis - Full Debye ring fitting Peter J. La. Puma 28 ©

Residual stress analysis - Full Debye ring fitting Peter J. La. Puma 29 ©

Residual stress analysis - Textured materials Peter J. La. Puma 30 © 1998 BRUKER

Residual stress analysis n Most accurate stress measurements ever due to full Debye ring

Residual stress analysis - Goebel Mirrors and pinhole collimators n Cross coupled Goebel mirrors

Residual stress analysis - software n Powerful - user friendly software n Easy display

Laser - Video Alignment Peter J. La. Puma 37 © 1998 BRUKER AXS, Inc.

$Micro-diffraction n Diffraction from points as small as 50 microns n Easy sample alignment$

Small Angle X-ray Scattering Peter J. La. Puma 39 © 1998 BRUKER AXS, Inc.

Small Angle X-ray Scattering Peter J. La. Puma 40 © 1998 BRUKER AXS, Inc.

Small Angle X-ray Scattering n Cross-coupled Goebel mirrors for highly intense parallel beam n

D 8 Discover with GADDS n More information faster than ever before n Pinhole

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$General Area Detector Diffraction Solution n 2 -D position sensitive detector n Collects data$

General Area Detector Diffraction Solution n 2 -D position sensitive detector n Collects data from the entire Debye ring without moving n True Photon counter n 200 micron spatial resolution n Variable detector distances 50 - 300 mm for resolution or intensity Peter J. La. Puma 12 © 1998 BRUKER AXS, Inc. All Rights Reserved

D 8 DISCOVER with GADDS n Real and useable intensity data from preferentially oriented samples n Single crystal, textured, and non-textured materials can be collected simultaneously in minutes n Small sample amounts can be measured quickly with real intensities n Large quantities of data and information with little or no sample movement Peter J. La. Puma 17 © 1998 BRUKER AXS, Inc. All Rights Reserved

$D 8 Discover with GADDS - Applications n Powder diffraction n Texture n Stress$

$Powder Diffraction n Analyze 70 deg. of 2 theta without moving the detector n$

Powder Diffraction n Analyze 70 deg. of 2 theta without moving the detector n Collect full patterns in seconds n Intensity integration removes preferred orientation effects n Integration converts data into 2 theta vs. intensity n Phase ID from small sample amounts Peter J. La. Puma 21 © 1998 BRUKER AXS, Inc. All Rights Reserved

$Powder diffraction - Analysis n Advanced phase identification with to PDF database n Quantitative$

Powder diffraction - Analysis n Advanced phase identification with to PDF database n Quantitative analysis n Percent crystallinity n Crystallite size and strain n Profile fitting n Lattice parameter indexing and refinement n Direct cut and paste into reports Peter J. La. Puma 22 © 1998 BRUKER AXS, Inc. All Rights Reserved

Texture analysis - Speed n Simultaneous measurement of single crystal, textured and untextured materials n Data for multiple pole figures are collected simultaneously in minutes n Chi motion not needed due to 2 -D detector n Peak height and background are collected simultaneously in one frame n Scintillation detector – 1296 separate sample positions – One pole figure n D 8 DISCOVER with GADDS – 72 separate sample positions – Multiple pole figures Peter J. La. Puma 24 © 1998 BRUKER AXS, Inc. All Rights Reserved

Texture data analysis n User friendly analysis software for pole figure representation n 3 -D and contour plot representation of pole figures n Calculation of ODF Peter J. La. Puma 25 © 1998 BRUKER AXS, Inc. All Rights Reserved

Residual stress analysis n Most accurate stress measurements ever due to full Debye ring fitting n Stress in different directions measured with one set of frames simultaneously n Peak position height and background from 1 set of frames n Stress values with standard deviations as low as 3% n Stress values from textured materials Peter J. La. Puma 31 © 1998 BRUKER AXS, Inc. All Rights Reserved

Residual stress analysis - Goebel Mirrors and pinhole collimators n Cross coupled Goebel mirrors provide a highly parallel highly intense Xray beam perfect for stress analysis n Pinhole collimators reduce spot size down to 50 microns n Coupled with laser /video alignment system, stress in sample can be mapped a function of position Peter J. La. Puma 32 © 1998 BRUKER AXS, Inc. All Rights Reserved

Residual stress analysis - software n Powerful - user friendly software n Easy display of all psi angles n Calculations of Sin squared psi data n Easy cut and paste into reports Peter J. La. Puma 33 © 1998 BRUKER AXS, Inc. All Rights Reserved

$Micro-diffraction n Diffraction from points as small as 50 microns n Easy sample alignment$

Micro-diffraction n Diffraction from points as small as 50 microns n Easy sample alignment and positioning with X, Y, Z stage and Laser-video microscope n Laser-video image on the computer screen with cross hairs n Patterns with accurate relative intensities due to data integration n Highly parallel, highly intense X-ray beam due to Goebel Mirrors n Highly intense X-ray beam due to Mono. Cap. TM Collimator n Diffraction data can be analyzed by phase identification, profile fitting, quantitative analysis, etc. Peter J. La. Puma 38 © 1998 BRUKER AXS, Inc. All Rights Reserved

Small Angle X-ray Scattering n Cross-coupled Goebel mirrors for highly intense parallel beam n Evacuated or He beam path for reduction of air scatter n D 8 DISCOVER with GADDS system measures isotropic and anisotropic scattering n SAXS has very low signals due to transmission measurements - perfect for D 8 DISCOVER with GADDS Peter J. La. Puma 41 © 1998 BRUKER AXS, Inc. All Rights Reserved

D 8 Discover with GADDS n More information faster than ever before n Pinhole collimators and laser/video microscope provide micro-diffraction, micro-stress, microtexture, etc. n Highly intense and highly parallel X-rays with Mono. Cap. TM collimators and Goebel mirrors n Most powerful and user- friendly software available Peter J. La. Puma 42 © 1998 BRUKER AXS, Inc. All Rights Reserved

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