ICFA Workshop on Future Light Sources FLS 2012

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ICFA Workshop on Future Light Sources, FLS 2012 Development of an Injector for the

ICFA Workshop on Future Light Sources, FLS 2012 Development of an Injector for the compact ERL Wednesday, March 7 th, 2012 Thomas Jefferson National Accelerator Facility Tsukasa Miyajima A, Yosuke Honda A, Masahiro Yamamoto A, Takashi Uchiyama A, Kotaro Satoh A, Shunya Matsuba B, Xiuguang Jin C, Makoto Kuwahara C, Yoshikazu Takeda C, Tohru Honda A, Yasunori Tanimoto A, Makoto Tobiyama A, Takashi Obina A, Ryota Takai A, Shogo Sakanaka A, Takeshi Takahashi A, Hiroshi Sakai A, Kensei Umemori A, Norio Nakamura A, Miho Shimada A, Kentaro Harada A, Toshiyuki Ozaki A, Akira Ueda A, Shinya Nagahashi A, Yukinori Kobayashi A, Nobuyuki Nishimori D, Ryoji Nagai D, Ryoichi Hajima D and Hwang Ji-Gwang E A KEK, High Energy Accelerator Research Organization B Hiroshima University C Nagoya University D JAEA, Japan Atomic Energy Agency E Kyungpook National University

ERL collaboration team • High Energy Accelerator Research Organization (KEK) – M. Akemoto, T.

ERL collaboration team • High Energy Accelerator Research Organization (KEK) – M. Akemoto, T. Aoto, D. Arakawa, S. Asaoka, A. Enomoto, S. Fukuda, K. Furukawa, T. Furuya, K. Haga, K. Harada, T. Honda, Y. Honda, T. Honma, K. Hosoyama, M. Isawa, E. Kako, T. Kasuga, H. Katagiri, H. Kawata, Y. Kobayashi, Y. Kojima, T. Matsumoto, H. Matsushita, S. Michizono, T. Mitsuhashi, T. Miura, T. Miyajima, H. Miyauchi, S. Nagahashi, H. Nakajima, E. Nakamura, K. Nakanishi, K. Nakao, T. Nogami, S. Noguchi, S. Nozawa, T. Obina, S. Ohsawa, T. Ozaki, C. Pak, H. Sakai, S. Sakanaka, H. Sasaki, Y. Sato, K. Satoh, M. Satoh, T. Shidara, M. Shimada, T. Shioya, T. Shishido, T. Suwada, T. Takahashi, R. Takai, T. Takenaka, Y. Tanimoto, M. Tobiyama, K. Tsuchiya, T. Uchiyama, A. Ueda, K. Umemori, K. Watanabe, M. Yamamoto, Y. Yamamoto, S. Yamamoto, Y. Yano, M. Yoshida • Japan Atomic Energy Agency (JAEA) – R. Hajima, R. Nagai, N. Nishimori, M. Sawamura • Institute for Solid State Physics (ISSP), University of Tokyo – N. Nakamura, I Itoh, H. Kudoh, T. Shibuya, K. Shinoe, H. Takaki • UVSOR, Institute for Molecular Science – M. Katoh, M. Adachi • Hiroshima University – M. Kuriki, H. Iijima, S. Matsuba • Nagoya University – Y. Takeda, T. Nakanishi, M. Kuwahara, T. Ujihara, M. Okumi • National Institute of Advanced Industrial Science and Technology (AIST) – D. Yoshitomi, K. Torizuka • JASRI/SPring-8 – H. Hanaki Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 2

Outline 1. 2. 3. 4. Status of R&D of compact ERL (c. ERL) injector

Outline 1. 2. 3. 4. Status of R&D of compact ERL (c. ERL) injector Beam operation in Gun Test Beamline Construction schedule of c. ERL injector Summary Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 3

Status of R&D of c. ERL injector Tsukasa Miyajima et. al. FLS 2012, March

Status of R&D of c. ERL injector Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 4

The Compact ERL for demonstrating our ERL technologies Goals of the compact ERL l

The Compact ERL for demonstrating our ERL technologies Goals of the compact ERL l l Demonstrating reliable operations of our R&D products (guns, SC-cavities, . . . ) Demonstrating the generation and recirculation of ultra-low emittance beams Parameters of the Compact ERL Parameters Beam energy (upgradability) 5 Me. V Average current 10 m. A (100 m. A in future) Normalized emittance AR south experimental hall: Gun Test Beamline 70 m 35 Me. V 125 Me. V (single loop) 245 Me. V (double loops) Injection energy Acc. gradient (main linac) ERL development building 15 MV/m 0. 1 mm·mrad (7. 7 p. C) 1 mm·mrad (77 p. C) Bunch length (rms) 1 - 3 ps (usual) ~ 100 fs (with B. C. ) RF frequency 1. 3 GHz Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 5

c. ERL injector • ERL injector: to generate electron beam with lower emittance and

c. ERL injector • ERL injector: to generate electron beam with lower emittance and shorter bunch length Buncher Parameters of the Compact ERL Injector Gun voltage 500 k. V Beam energy 5 – 10 Me. V Beam current 10 – 100 m. A Normalized rms emittance en = e (gb) Bunch length (rms) 1 mm·mrad (77 p. C/bunch) 0. 1 mm·mrad (7. 7 p. C/bunch) 1 – 3 ps (0. 3 – 0. 9 mm) Before construction of a full injector, we continue R&Ds at the AR south experimental hall. Tsukasa Miyajima et. al. Diagnostic beamline for Injector Merger 500 k. V DC gun Injector Cryomodule Design layout of c. ERL injector. • R&D items – 500 k. V DC gun – Laser system – Bunching cavity – Injector Cryomodule (see H. Sakai’s presentation) – Injector beamline – Cathode materials FLS 2012, March 5 -9, 2012 6

AR south experimental hall • R&Ds about DC gun and injector beamline ERL development

AR south experimental hall • R&Ds about DC gun and injector beamline ERL development building Laser Room 2 nd 500 k. V DC gun system AR south experimental hall: Gun Test Beamline NPES 3, DC 200 k. V Gun developed by Nagoya Univ. Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 7

Status of DC 500 k. V gun systems • JAEA 1 st Gun –

Status of DC 500 k. V gun systems • JAEA 1 st Gun – HV test with a stem electrode: 500 k. V (510 k. V) for 8 hours without any discharge – Beam generation at 300 k. V – Scheduled to be installed by Oct. 2012 to c. ERL beamline. See N. Nishimori-san’s talk, FLS 2012. JAEA 1 st Gun • KEK 2 nd Gun – Titanium chamber and ceramic tube were fabricated. – Now modifying HV power supply. – Out gassing rate and pumping speed of extreme high vacuum system were measured. Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 KEK 2 nd Gun 8

Overview of 2 nd gun vacuum system • High voltage insulator – Inner diameter

Overview of 2 nd gun vacuum system • High voltage insulator – Inner diameter of f=360 mm – Segmented structure • Low outgassing material – Large titanium vacuum chamber (ID~f 630 mm) – Titanium electrode, guard rings • Main vacuum pump system – Bakeable cryopump – NEG pump (> 1 x 104 L/s, for hydrogen) e- beam • Large rough pumping system – 1000 L/s TMP & ICF 253 Gate valve Goal Ultimate pressure : 1 x 10 -10 Pa (during the gun operation) Anode (0 V) Cathode (-500 k. V) M. Yamamoto, IPAC 2011 Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 9

Total outgassing rate measurement • Assembled dc gun system Spinning rotor gauge (SRG) was

Total outgassing rate measurement • Assembled dc gun system Spinning rotor gauge (SRG) was employed to suppress outgassing from the gauge. M. Yamamoto, IPAC 2011 Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 10

Estimation of total outgassing rate from all system (The values of the total outgassing

Estimation of total outgassing rate from all system (The values of the total outgassing rate are equivalent for hydrogen. ) Surface area A [m 2] Total outgassing Q [Pa・m 3/s] (IGs) Gun chamber body 2. 4 Ceramic insulator tubes 1. 6 2. 7 x 10 -10 1. 1 x 10 -9 Guard ring electrodes Gate valves & View ports 2 - ~0. 3 - Installed components Total outgassing Q [Pa・m 3/s] (SRG) 1. 1 x 10 -10 (w/o viewports) • The total outgassing rate of the dc gun with main components was suppressed to Q~1 x 10 -10 [Pa m 3/s]. – Outgassing from the remaining components should be suppressed. • The possibility of generating extreme high vacuum of 1 x 10 -10 Pa in the actual dc gun is still remained ! M. Yamamoto, IPAC 2011 Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 11

Laser System: for c. ERL first beam operation • Electron beam specification (first beam

Laser System: for c. ERL first beam operation • Electron beam specification (first beam operation of c. ERL) – Repetition rate: 1. 3 GHz – Average current: 10 m. A(7 p. C/bunch) – Normalized emittance: 1μm(at return loop) or lower – Pulse duration: 30 ps(at gun exit, this will be compressed after acceleration) • Laser specification – Wavelength: 532 nm (shorter than 700 nm) – Average power: 2. 3 W(2 n. J/pulse)(on cathode) • (at laser room: 5 W(green), 25 W(IR)) – Pulse duration: stacking 8 pulses of 8 ps pulse • Achievements – CW 1064 nm, 36 W output – pulse 178. 5 MHz, 1064 nm, 5 W (peak power equivalent with 35 W, 1300 MHz) – SH generation • Development for first preparation of c. ERL is done. Courtesy: Y. Honda Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 12

Bunching cavity Courtesy: T. Takahashi, S. Sakanaka • A 1. 3 GHz bunching cavity

Bunching cavity Courtesy: T. Takahashi, S. Sakanaka • A 1. 3 GHz bunching cavity and a input coupler: now fabricating • Cold model: to check frequency and external Q of input coupler Measurement results of cold model with model coupler parameter Cold model of bunching cavity (Aluminum) with input coupler frequency fa = 1297. 9292 MHz Coupling of coulper b = 0. 862 Loaded Q QL = 5, 870 Unloaded Q Q 0 = (1+b)QL = 10, 940 External Q of coupler Qex = Q 0/b = 12, 700 Temperature T = 23. 9℃ Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 13

Gun test beamline for c. ERL injector • Purposes of test beam line –

Gun test beamline for c. ERL injector • Purposes of test beam line – To gain operation experience of the low energy beam. – To evaluate performance of the DC guns and cathode materials by an additional diagnostic line to measure emittance and bunch length – To develop a 500 k. V gun and the injector line used at c. ERL. NPES 3, 200 k. V gun Test beamline Laser system Test area for 500 k. V gun Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 14

Layout of gun test beamline 4 th solenoid 3 rd solenoid 5 th view

Layout of gun test beamline 4 th solenoid 3 rd solenoid 5 th view screen 1 st solenoid 2 nd solenoid 1 st slit (vertical) 1 st view screen 2 nd slit (vertical) 3 rd view screen 4 th view screen deflector The same layout as c. ERL injector Beam diagnostic line (emittance, Bunch length measurements) Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 Beam dump line 15

Gun test beamline NPES 3, 200 k. V gun Injector beamline without buncher Tsukasa

Gun test beamline NPES 3, 200 k. V gun Injector beamline without buncher Tsukasa Miyajima et. al. Beam diagnostic line Beam dump line FLS 2012, March 5 -9, 2012 16

Beam operation in Gun Test Beamline Tsukasa Miyajima et. al. FLS 2012, March 5

Beam operation in Gun Test Beamline Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 17

Beam operation in Gun Test Beamline • Purposes of beam operation – To study

Beam operation in Gun Test Beamline • Purposes of beam operation – To study space charge effect – To study cathode property (initial emittance, time response) • Initial emittance of bulk Ga. As cathode – Bulk cathode was already measured. I. V. Bazarov, et al, J. Appl. Phys. 103 (2008) 054901 – How is effect of thermalization in different active layer thickness of Ga. As cathode? Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 18

Effect of active layer thickness and wave length • • S. Matsuba, et. al.

Effect of active layer thickness and wave length • • S. Matsuba, et. al. , JJAP accepted Electrons around surface were not thermalized. The emittance is determined by the ratio of thermalized electrons to all electrons. • Effect of laser wave length – Initial energy – Initial electron distribution: exp(-az) • 544 nm: absorption length, a ~ 100 nm • 785 nm: absorption length, a ~ 1000 nm 100 nm and 1000 nm Initial longitudinal electron distribution in cathode 100 nm thickness 1000 nm thickness Laser wave length: 544 nm Laser wave length: 785 nm Thermalized electrons Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 surface 19

Thickness-controlled cathode • Two Ga. As photocathodes with active layer thicknesses of 100 and

Thickness-controlled cathode • Two Ga. As photocathodes with active layer thicknesses of 100 and 1000 nm fabricated by metalorganic vapor phase epitaxy (MOVPE) at Nagoya University 100 nm and 1000 nm S. Matsuba, et. al. , JJAP accepted Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 20

Setup of emittance measurement Conditions • Laser – Wave length: 544 nm and 785

Setup of emittance measurement Conditions • Laser – Wave length: 544 nm and 785 nm – Time structure: CW • Gun voltage: 100 k. V • Beam current: few n. A Emittance measurement: Waist scan method S. Matsuba, et. al. , JJAP accepted Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 21

MTE measurement results 100 nm 1000 nm 544 nm 785 nm Thermal energy of

MTE measurement results 100 nm 1000 nm 544 nm 785 nm Thermal energy of room temperature <Ekx>: Mean Transverse Energy (MTE) • MTE depends on laser wave length. • But, MTE dose not depend on active layer thickness. – The results indicate that any electrons must have been thermalized. • Measured MTEs are still higher than thermal energy of room temperature. What dose increase the emittance? Surface roughness S. Matsuba, et. al. , JJAP accepted Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 22

Surface roughness of cathode • The surface roughness was measured by Atomic Force Microscopy.

Surface roughness of cathode • The surface roughness was measured by Atomic Force Microscopy. AFM measurement result 5 mm× 5 mm Calculation result of emittance growth Rms surface roughness: 7 mm Period: 100 nm |�� | = 0. 2 e. V rms 2. 99 nm Rmax 50. 5 nm AFM measurement result 90 mm× 90 mm rms 7 nm Rmax 250 nm Tsukasa Miyajima et. al. The increase in MTE is estimated to be about 20 me. V. S. Matsuba, et. al. , JJAP accepted FLS 2012, March 5 -9, 2012 23

Construction schedule of c. ERL injector Tsukasa Miyajima et. al. FLS 2012, March 5

Construction schedule of c. ERL injector Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 24

Status of ERL Development building for c. ERL • 2 Mar, 2012 From return

Status of ERL Development building for c. ERL • 2 Mar, 2012 From return loop 2 K cold box and end box for injector SRF cavity Electron beam Place of DC 500 k. V gun Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 25

Road Map of ERL Japanese Fiscal Year (from April to March) 2008 2009 2010

Road Map of ERL Japanese Fiscal Year (from April to March) 2008 2009 2010 2011 2012 2013 2014 2015 2016 2017 2018 2019 2020 R&D of ERL key elements Prep of ERL Test Facility c. ERL Beam test and test experiments construction Improvements towards 3 Ge. V class ERL Construction of 3 Ge. V ERL User run • Installation of JAEA 1 st Gun: Oct. 2012 • 1 st beam operation of c. ERL: Mar. 2012 Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 26

Summary Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 27

Summary Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 27

Summary • Status of R&D of c. ERL injector – DC photo cathode gun

Summary • Status of R&D of c. ERL injector – DC photo cathode gun • JAEA 1 st Gun : HV processing and beam generation succeeded. • KEK 2 nd Gun: now developing – Laser system: Development for first preparation of c. ERL is done. – Bunching cavity: now fabricating • Beam operation in Gun Test Beamline – Initial emittance measurements of Ga. As based cathodes are done. – Temporal response measurements – Study of space charge effect • Construction and commissioning plan of c. ERL injector – Oct. 2012: installation of JAEA 1 st Gun – Mar. 2013: 1 st beam commissioning of c. ERL Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 28

Buck up slides Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 29

Buck up slides Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 29

Summary & Future of DC gun vacuum system • The total outgassing rate of

Summary & Future of DC gun vacuum system • The total outgassing rate of the dc gun with main components was suppressed to Q~1 x 10 -10 [Pa m 3/s]. – Outgassing from the remaining components should be suppressed. • The pumping speed of the 20 K bakeable cryopump was obtained for nitrogen, methane, argon, and hydrogen. – The ultimate pressure of the bakeable cryopump was limited by adsorption equilibrium of adsorbent for hydrogen. – A test about 4 K bakeable cryopump is in progress. • The possibility of generating extreme high vacuum of 1 x 10 -10 Pa in the actual dc gun is still remained ! M. Yamamoto, IPAC 2011 Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 30

Laser system: conceptual design Courtesy: Y. Honda Tsukasa Miyajima et. al. FLS 2012, March

Laser system: conceptual design Courtesy: Y. Honda Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 31

Laser system: Development work at KEK Courtesy: Y. Honda • Since August 2011, KEK

Laser system: Development work at KEK Courtesy: Y. Honda • Since August 2011, KEK started development high power laser system by ourselves. • KEK has no experience of high power fiber amplifier system so far. Started from a basic tests with a minimal system. Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 32

Fiber amplifier (test with a CW laser)Courtesy: Y. Honda • • PCF 1. 5

Fiber amplifier (test with a CW laser)Courtesy: Y. Honda • • PCF 1. 5 m (NKT photonics, DC-300 -40 -PZ-Yb) Seed 1064 nm, cw laser 80 W pump, 37 W output. Consistent with a model expectation based on low power tests. ASE noise grows at 1035 nm, but it can be suppressed at >1 W input power with a suitable pre-amplifier. spectrum ASE noise 1064 nm signal calculation Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 33

Quality of high power output • • Features of PCF are confirmed Diffraction limited

Quality of high power output • • Features of PCF are confirmed Diffraction limited transverse mode Polarization maintaining Output power is stable (as long as the environment is stable). No power damages so far. Courtesy: Y. Honda transverse mode quality stability polarization stability Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 34

Test with a pulsed laser • • • Preparing a 1. 3 GHz Nd:

Test with a pulsed laser • • • Preparing a 1. 3 GHz Nd: YVO passive mode-lock laser (Time-Bandwidth Product, GE-100) Peak power tests with a same type laser of 178. 5 MHz. 5 W at 178. 5 MHz is the equivalent pulse power of 35 W 1300 MHz Amplification, fine. Spectrum (0. 33 nm FWHM), getting a little broad due to non-linearity, seems not so significant. Pulse width (7. 5 ps FWHM), looks no difference. Courtesy: Y. Honda power amplification pulse width (auto-correlator) spectrum Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 35

Second harmonics • • • Courtesy: Y. Honda Type-1 NCPM LBO, 14 mm 532

Second harmonics • • • Courtesy: Y. Honda Type-1 NCPM LBO, 14 mm 532 nm, 0. 6 W could be produced by 1064 nm, 178. 5 MHz, 3 W fundamental. Scaling this result to 1300 MHz with same pulse energy 532 nm, 4. 3 W can be expected by 1064 nm, 1300 MHz, 21 W Good enough for first goal of c. ERL Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 36

Laser system: summary Laser system for c. ERL : Nd: YVO mode-locked laser +

Laser system: summary Laser system for c. ERL : Nd: YVO mode-locked laser + Yb-PCF amplifier Method for fiber input coupling Modeling and understanding fiber amplifier Result – CW 1064 nm, 36 W output – pulse 178. 5 MHz, 1064 nm, 5 W (peak power equivalent with 35 W, 1300 MHz) – SH generation • Development for first preparation of c. ERL is done. • • • Next, actual system assembly & higher power development Courtesy: Y. Honda Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 37

Bunching Cavity • A 1. 3 GHz bunching cavity and a input coupler are

Bunching Cavity • A 1. 3 GHz bunching cavity and a input coupler are fabricating. Design parameters of buncher parameter Frequency (calc. without input coupler) 1302. 89 MHz Unloaded Q (calc. ) 25, 000 Rsh/Q for b=1 232. 8 W Rsh/Q for b=0. 863 (500 ke. V) 194. 7 W Rsh/Q for b=0. 8 173. 4 W Courtesy: T. Takahashi, S. Sakanaka Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 38

MTE and laser spot size • Mean Transverse Energy (MTE) was estimated for two

MTE and laser spot size • Mean Transverse Energy (MTE) was estimated for two different laser spot size. Measurement results of 1000 nm cathode S. Matsuba, et. al. , JJAP accepted Tsukasa Miyajima et. al. FLS 2012, March 5 -9, 2012 39

Optics Design for c. ERL 1 st commissioning • • • We are designing

Optics Design for c. ERL 1 st commissioning • • • We are designing a beam optics for the compact ERL (c. ERL) 1 st commissioning. The layout has a long straight section (8 m) from the exit of merger to the entrance of main linac for diagnostic system. In the future, main SRF cavities will be installed on the long straight section. Parameters of the Compact ERL 1 st commissioning 5 Me. V beam paths through the long straight section. Parameters Gun voltage 500 k. V Injection energy 5 Me. V Beam energy 35 Me. V Average current 10 m. A (7. 7 PC/bunch) Acc. gradient (injector) 7. 5 MV/m Acc. gradient (main linac) 15 MV/m Normalized emittance < 1 mm·mrad Bunch length (rms) 1 - 3 ps (usual) RF frequency 1. 3 GHz Long straight for additional SRF cavities in the future. The straight section is used for beam instrumentation to measure injected beam. Tsukasa Miyajima et. al. ERL 2011, October 16 -21, 2011, 40

Effect of gun voltage Preliminary results Bunch charge: 20 p. C/bunch Gun voltage: 500

Effect of gun voltage Preliminary results Bunch charge: 20 p. C/bunch Gun voltage: 500 k. V or 600 k. V At exit of merger (1) 0. 6 mm (2 ps) bunch length enx = 0. 14 mm mrad with 500 k. V enx = 0. 13 mm mrad with 600 k. V (2) 0. 9 mm (3 ps) bunch length enx = 0. 12 mm mrad with 500 k. V enx = 0. 11 mm mrad with 600 k. V Results of Gun and solenoid beamline Tsukasa Miyajima FLS 2010, March 1 -5, 2010, 41

Physics in ERL injector (1) (2) (3) (4) (5) (6) Space charge effect (Coulomb

Physics in ERL injector (1) (2) (3) (4) (5) (6) Space charge effect (Coulomb force between electrons) Solenoid focusing (Emittance compensetion) RF kick in RF cavity Higher order dispersion in merger section Coherent Synchrotron Radiation (CSR) in merger section Response time of photo cathode(It generates tail of emission. ) These effects combine in the ERL injector. To obtain high quality beam at the exit of merger, optimization of beamline parameters is required. Method to research the beam dynamics: Macro particle tracking simulation with space charge effect is used. The simulation code have to include (1) External electric and magnetic field, (2) Space charge effect (3 D space charge). Tsukasa Miyajima FLS 2010, March 1 -5, 2010, SLAC National Accelerator Laboratory 42

Emittance growth in drift space with 5 Me. V • • The emittance growth

Emittance growth in drift space with 5 Me. V • • The emittance growth in a drift space with 5 Me. V and 7. 7 p. C/bunch was calculated. A quadrupole magnet is placed at 2 m. The strength is varied from 0 to 5 m-1. Horizontal direction We can reduce the emittance growth in the drift space due to adjust quadrupole magnet strength. The results shows that the appropriate layout of the quadrupole magnet can reduce the emittance growth. In three-step optimization, we used other different layout of quadrupole magnets. Vertical direction Tsukasa Miyajima et. al. ERL 2011, October 16 -21, 2011, 43

Emittance growth in drift space • Emittance growth in drift space with 7. 7

Emittance growth in drift space • Emittance growth in drift space with 7. 7 p. C/bunch. The results shows that the emittance growth with 5 Me. V is not negligible. Tsukasa Miyajima et. al. ERL 2011, October 16 -21, 2011, 44