Using Signals in Test Description Capability and a

Using Signals in Test. Description & Capability and a Test. Results Example © Copyright EADS TEST & SERVICES 2006

Signal Capture Generating 1641 Signals from a Product Acceptance Specification (PAS) t Translation from the PAS to 1641 signals is reasonably straightforward – – This is because PAS is written in terms of UUT Extraction is a manual process E. g. : PAS ‘Monitor SK 2 -F with respect to 0 V at SK 2 -s and verify that the voltage is +5. 0 V +/-0. 2 V’ Translates into: 1641 Signals <Two. Wire name="TW 1" hi="SK 2_F" lo="SK 2_s" /> <Instantaneous name="Inst 1" In="TW 1" type="Voltage" samples="1" nominal="5. 0 V" LL="4. 8 V" UL="5. 2 V" /> © Copyright EADS TEST & SERVICES 2006

Signal Capture Generating 1641 Signals from Existing Source Code t In older ATPs, this is often all that is available. t Code, style & structure may be unfamiliar t Contain ATE specific information. t t Extracting any large amounts of information manually is very laborious and, thus, prone to error. Test Program Irregular structure and ATE specifics mean that automatic extraction of signals is not possible – Without standardised extraction, the test program is being virtually re-written and must go through acceptance. © Copyright EADS TEST & SERVICES 2006 1641 Signals

Test Description <? xml version="1. 0" encoding="UTF-8" ? >  <Test. Description xmlns="http: //www. atml. org/DRAFT/Test. Description " xmlns: c="http: //www. atml. org/CANDIDATE/Common" xmlns: xsi="http: //www. w 3. org/2001/XMLSchema-instance " xsi: schema. Location="http: //www. atml. org/DRAFT/Test. Description Draft_3_TD. Diag. Test. Description. xsd "> <Detailed. Test. Information> <Diag_Test_Description> <Test. Group name="3. 2. 2. 1"> <Precondition>   <Signal Out="TW 1" xmlns="STDBSC" xmlns: xsi="http: //www. w 3. org/2001/XMLSchema-instance " xsi: schema. Location="STDBSC. xsd"> <PSU name="PSU 5" ampl="45. 5 V errlmt ± 0. 5 V" current_limit="550 m. A errlmt ± 30 m. A" xmlns="TSFLEUATP" xmlns: xsi="http: //www. w 3. org/2001/XMLSchema-instance " xsi: schema. Location="TSFLEUATP. xsd" /> <Two. Wire name="TW 1" In="PSU 5" hi="Battery. Pos" lo="Battery. Neg" /> </Signal> </Precondition> <Test name="test 1">  <Output> <Response> <Value> <Signal Out="Inst 1" xmlns="STDBSC" xmlns: xsi="http: //www. w 3. org/2001/XMLSchema-instance " xsi: schema. Location="STDBSC. xsd"> <Two. Wire name="TW 1" hi="SK 2_F" lo="SK 2_s" /> <Timed. Event name="TE 1" delay="1 s" repetition="1" /> <Instantaneous name="Inst 1" In="TW 1" Gate="TE 1" type="Voltage" samples="1" nominal="5. 0 V" LL="4. 8 V" UL="5. 2 V" /> </Signal> </Value> </Response> </Output> <Limits> <Limts. Pair> <Limit xsi: type="std: Voltage" value="4. 8" units="V" /> <Limit xsi: type="std: Voltage" value="5. 2" units="V" /> <Nominal xsi: type="std: Voltage" value="5. 0" units="V" /> </Limts. Pair> </Limits> </Test>. . . <Precondition> <Signal Out="TW 1" - - - > <PSU name="PSU 5" ampl=“ 23. 5 V errlmt ± 0. 5 V" current_limit="550 m. A errlmt ± 30 m. A" - - - /> <Two. Wire name="TW 1" In="PSU 5" hi="Battery. Pos" lo="Battery. Neg" /> </Signal> <Test name="test 1"> <Signal Out="Inst 1" - - - > <Two. Wire name="TW 1" hi="SK 2_F" lo="SK 2_s" /> <Timed. Event name="TE 1" delay="1 s" repetition="1" /> <Instantaneous name="Inst 1" In="TW 1" Gate="TE 1" type="Voltage" samples="1" nominal="5. 0 V" LL="4. 8 V" UL="5. 2 V" /> </Signal> <Test name="test 2"> < Signal …. . © Copyright EADS TEST & SERVICES 2006

Test Program. NET (e. g. Test. Base) ' Create EU Power Supply Signal Set psu = ate. Require("PSU") psu. Name = "PSU 1" psu. ampl = "23. 5 errlmt ± 0. 5 V" psu. current_limit = "550 m. A" Set tw = ate. Require("Two. Wire") tw. Name = "TW 1" tw. In = "PSU 1" tw. hi = "Battery. Pos" tw. lo = "Batter. Neg" Test. Stand psu. Out. Run ' Create Measuremnt Set monitor = ate. Require("<Signal name='T 030 -0060' Out='Inst 1' - - - >" & _ "<Two. Wire name='TW 1' hi='SK 2_F' lo='SK 2_s'/>" & _ "<Timed. Event name='TE 1' delay='1 s' repetition='1'/>" & _ "<Instantaneous name='Inst 1' In='TW 1' Gate='TE 1' type='Voltage' samples='1' nominal='5. 0 V' LL='4. 8 V' UL='5. 2 V'/>" & _ "</Signal>") monitor. Out. Run 5000 monitor. Out. Stop Set monitor = Nothing © Copyright EADS TEST & SERVICES 2006

Capability <Resource name="Racal 4152 A" uuid="{C 37301 A 3 -C 41 C-4025 -9 FC 2 -1 F 7237859 D 16} "> <interface> <Resource name="Racal 4152 A" uuid="{C 37301 A 3 -C 41 C-4025 -9 FC 2 -1 F 7237859 D 16} "> <xs: schema xmlns: xs="http: //www. w 3. org/2001/XMLSchema " element. Form. Default ="qualified"> <xs: element name="Racal 4152 A"> <xs: annotation> <xs: documentation > The resource description of a Racal 4152 A DMM and associated connection to the UUT. </xs: documentation > </xs: annotation> <xs: complex. Type> <xs: complex. Content > <xs: extension base="Signal. Function. Type "> <xs: attribute name="uut_pin_hi" type="xs: string"/> <xs: attribute name="uut_pin_lo" type="xs: string"/> </xs: extension> </xs: complex. Content > </xs: complex. Type> </xs: element> </xs: schema> </interface> <model> <Signal Out="Racal 4152 A" … > <Two. Wire name="TW 1" hi="uut_pin_hi" lo="uut_pin_lo"/> <One. Of> <Instantaneous name="Racal 4152 A" type="Voltage" nominal="range-300 Vto 300 V errlmt± 0. 0019%" UL="300 V"/> <Instantaneous name="Racal 4152 A" type="Current" nominal="range-3 Ato 3 A errlmt± 0. 015%"/> <Instantaneous name="Racal 4152 A" type="Voltage" nominal="range 0 to 100 MR errlmt± 0. 0025%"/> </One. Of> </Signal> </model> </Resource> <Interface> : <xs: attribute name="uut_pin_hi" type="xs: string"/> <xs: attribute name="uut_pin_lo" type="xs: string"/> : <model> <Signal Out="Racal 4152 A" … > <Two. Wire name="TW 1" hi="uut_pin_hi" lo="uut_pin_lo"/> <One. Of> <Instantaneous name="RI 4152 A" type="Voltage" nominal="range-300 Vto 300 V errlmt± 0. 0019%"/> <Instantaneous name="RI 4152 A" type="Current" nominal="range-3 Ato 3 A errlmt± 0. 015%"/> <Instantaneous name="RI 4152 A" type=“Resistance" nominal="range 0 to 100 MR errlmt± 0. 0025%"/> </One. Of> </Signal> </model> © Copyright EADS TEST & SERVICES 2006

Architecture © Copyright EADS TEST & SERVICES 2006

General Architecture Using a Signal Interface Run-Time System ATE Signal Interface Test Signal Native Driver RFSynth Native Driver Switch Test Requirement Signal Interface (RAI? ) Test Program DMM Test. Results Logger © Copyright EADS TEST & SERVICES 2006 UUT

Test. Results Sample ========== PROGRAM NUMBER M 75375 -000 -01 ISSUE 2 MY TEST PROGRAMME UUT SERIAL NUMBER : DATE : 2005 -03 -16 T 12: 24: 28 OPERATOR NAME : MCORNISH ==================== TEST PASS HIGH SOURCE TEST T 020 -0030 HL = 5. 200000 MV = 5. 057660 LL = 4. 800000 ========== TEST PASS HIGH SOURCE TEST T 020 -0040 HL = 15. 100000 MV = 15. 001900 LL = 14. 500000 © Copyright EADS TEST & SERVICES 2006

Results Data Vs. Modelled Data t No significant differences found between the native and

Synthetic Instruments 0. 0 -0. 580187 0. 806531 0. 552474 -1. 48153 1. 20912 0. 00574553 -0. 642036 0. 644192 0. 806355 -1. 44827 1. 076 0. 0225363 -0. 680986 0. 45079 1. 03136 -1. 35919 0. 904361 0. 0490603 -0. 693509 0. 233323 1. 21823 -1. 21823 0. 701864 0. 0832186 -0. 677141 -1. 18625 e-006 1. 35919 -1. 03135 0. 477282 0. 122247 -0. 630658 -0. 240079 1. 44827 -0. 806354 0. 240075 0. 162886 -0. 554193 -0. 477285 1. 48153 -0. 162885 -1. 61061 e-006 0. 20157 -0. 449294 -0. 701867 1. 4573 -0. 122247 -0. 233327 0. 234652 -0. 318911 -0. 904362 1. 37621 -0. 0832179 -0. 450794 0. 258628 -0. 167325 -1. 07601 1. 2412 -0. 0490596 -0. 644193 0. 27036 5. 74574 e-007 -1. 20912 1. 05739 -0. 55247 -0. 806534 0. 267287 0. 176622 -1. 29746 0. 831908 -0. 280033 -0. 932297 0. 247606 0. 355376 -1. 33651 0. 573581 2. 78904 e-006 -1. 01764 0. 210415 0. 528675 -1. 32369 0. 292576 0. 276485 -1. 0605 0. 155813 0. 688844 -1. 25852 -2. 44381 e-006 0. 538547 -1. 06066 0. 0849475 0. 828459 -1. 14267 -0. 292581 0. 776035 -1. 01965 -1. 51036 e-007 0. 940695 -0. 979921 -0. 573582 0. 979923 -0. 940694 -0. 0958763 1. 01966 -0. 776031 -0. 831913 1. 14267 -0. 828458 -0. 19868 1. 06066 -0. 538544 -1. 05739 1. 25852 -0. 688842 -0. 303734 1. 0605 -0. 276483 -1. 2412 1. 32369 -0. 528674 -0. 405897 1. 01764 1. 85936 e-006 -1. 37621 1. 33651 -0. 355374 -0. 499816 0. 932295 0. 280037 -1. 4573 1. 29746 -0. 17662 © Copyright EADS TEST & SERVICES 2006

Comparison of Effort t Typical Effort to Generate Parametric Tests in the Power/Frequency Domain (Aeroflex) Generate Native Test from General Documentation Port Native Test to IVI (Test. Stand) Port IVI Test to 1641 (Test. Stand) 1 month 1 week 1 Day (given the presence of the 1641 elements) time © Copyright EADS TEST & SERVICES 2006

Where We’re Up To t IEEE Std. 1641 -2004 Signal & Test Definition – Signal-based test definition standard. – Requirement of Mo. D ATS Procurement Policy. – Utilised in areas of IEEE P 1671 ATML. t IEEE 1641 implementation studies: – Phase 1 - Analogue signals/3 test platforms - Racal Instruments. – Phase 2 - Complex RF and a Synthetic Test Platform – Aeroflex. – Phase 3 - Digital signals/ test platforms - under negotiation. – Phase 4 – Parallel development; comparison of traditional vs. 1641. © Copyright EADS TEST & SERVICES 2006

Conclusions t IEEE Std. 1641 has been shown to be capable of defining: – Portable analogue signals, – Typical RF parametric tests. t t Significant effort required to extract the information required to define a 1641 (platform independent) test, from an existing, non-standard or proprietary, test architecture. Though not a unique approach, 1641 represents a departure from many existing test methodologies. – Training would address many issues. t No significant differences observed (existing vs. 1641) for: – Test results. – Speed of execution. © Copyright EADS TEST & SERVICES 2006