The Future of NVIS Display Measurement Dr Richard

The Future of NVIS Display Measurement Dr. Richard Young Optronic Laboratories, Inc. ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Introduction Thanks to the excellent quality of modern scanning instruments, NVIS compatibility measurements have become almost routine. What improvements could instrument manufacturers make… ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Introduction A wish-list for improvements… • Better sensitivity, so low luminance small spot sizes can be measured as easily as high luminance large spot sizes. • Less variation in results • Faster scans • Greater portability and ruggedness • Lower cost ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Sensitivity and Variability Scanning systems have plenty of sensitivity ALI Advanced Seminar, 2006 Much of the variability is due to the longer wavelengths Optronic Laboratories

The Future of NVIS Display Measurement Sensitivity and Variability The OL 770 -NVS detector is based on silicon, and hence has a different shape, ALI Advanced Seminar, 2006 There is no dramatic change in longer wavelength sensitivity Optronic Laboratories

The Future of NVIS Display Measurement Spectroradiometer design ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Spectroradiometer design ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Spectroradiometer design ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement The Multiplex Advantage The multiplex advantage means that an instrument simultaneously measuring a signal over a range of frequencies obtains a t 1/2 advantage in the time t required to obtain a given signal-to-noise ratio compared to that which would be necessary using dispersive methods if the noise is detector-limited. http: //scienceworld. wolfram. com/physics/Multiplex. Advantage. html • When all the light is “seen” all the time: – Noise is decreased. – Sensitivity is increased. – Measurements can be faster. ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Spectroradiometer design • The OL 770 -NVS is a special type of spectroradiometer, many decades better than other multi-channel devices. – Far higher sensitivity – Much lower noise – Orders of magnitude lower stray light – Vastly improved electronics – Dedicated software – State-of-the-art technology ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement MIL Spec: Others • A. 3. 3. Wavelength accuracy & repeatability – Accuracy typical <0. 5 nm, spec. 1 nm – Repeatability typical <0. 01 nm, spec. 0. 5 nm • A. 3. 4. Current Resolution – 16 bit, spec. 12 bit. • A. 3. 5. Zero Drift – Typical <0. 01%, spec. 0. 2% ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement MIL Spec: Others • A. 3. 6. Linearity – In scale <0. 5%, spec. 1% – Between scales <0. 1%, spec. 2% • A. 3. 7. Signal Conditioning – Required controls for improving s/n provided • A. 3. 8. Stray light – Passes easily ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement MIL Spec: Others • A. 3. 9. Spectroradiometer Optics – Full scale at <0. 1 f. L, spec. 1 f. L (at 0. 007” spot size) • A. 3. 10. Spectroradiometer Viewing System – Exact, spec. <5% of spot diameter • A. 3. 11. Spectroradiometer Accuracy – Typically < 1%, spec. 5% – Typically u’v’ <0. 0003, spec. 0. 007 ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Other Advantages • Since there are no moving parts – the construction is rugged and compact – results are highly repeatable – time taken in moving the monochromator, changing filters etc. is avoided ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Other Advantages • Since there is no photomultiplier – A very expensive component is avoided – The detector is not damaged by strong light – High voltages are not required • Since all the wavelengths are measured at the same time – It doesn’t matter if the source is d. c. , a. c. , modulated or flashed ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study Green B NVIS Yellow ALI Advanced Seminar, 2006 NVIS Red Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement An Intercomparison Study ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement NVIS Green B Results For 1 -2 minute scan ALI Advanced Seminar, 2006 For <1 second scan Optronic Laboratories

The Future of NVIS Display Measurement NVIS Green B Results For 2 minute scan For 1 -2 minute scan ALI Advanced Seminar, 2006 For <1 second scan Optronic Laboratories

The Future of NVIS Display Measurement NVIS Green B Results ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement NVIS Red Results ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement NVIS Red Results ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement NVIS Yellow Results ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement NVIS Yellow Results ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement Study Conclusions • All systems gave extremely good repeatability in NRa, NRb and chromaticity. • All systems gave the same results with very low uncertainties. • All systems showed that NRa and NRb were essentially constant across a wide luminance range for each display. • All systems showed chromaticity was essentially constant with luminance for each display. ALI Advanced Seminar, 2006 Optronic Laboratories

The Future of NVIS Display Measurement General Conclusions • Developments over the past year have made it possible to design a new type of system for NVIS display measurements. • This new type of system represents a quantum leap in performance and value. • All the wish-list items are fulfilled. ALI Advanced Seminar, 2006 Optronic Laboratories