Testing Analog Digital Products Lecture 6 Combinational ATPG

Testing Analog & Digital Products Lecture 6: Combinational ATPG n n n Copyright 2001, Agrawal & Bushnell ATPG problem Example Algorithms Multi-valued algebra D-algorithm Podem Other algorithms ATPG system Summary Day-1 PM-3 Lecture 6 1

ATPG Problem n ATPG: Automatic test pattern generation Given n n A circuit (usually at gate-level) A fault model (usually stuck-at type) Find n n n A set of input vectors to detect all modeled faults. Core solution: Find a test vector for a given fault. Combine the “core solution” with a fault simulator into an ATPG system. Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 2

What is a Test? Fault activation Fault effect Primary inputs (PI) X 1 0 0 1 X X Combinational circuit 1/0 Stuck-at-0 fault Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 1/0 Primary outputs (PO) Path sensitization 3

Multiple-Valued Algebras Symbol D D 0 1 X G 0 G 1 F 0 F 1 Fault-free Faulty Alternative Representation circuit Circuit 1/0 0/1 0/0 1/1 X/X 0/X 1/X X/0 X/1 Copyright 2001, Agrawal & Bushnell 1 0 0 1 X X Day-1 PM-3 Lecture 6 0 1 X X X 0 1 Roth’s Algebra Muth’s Additions 4

An ATPG Example 1 Fault activation 2 Path sensitization 3 Line justification 1 D

ATPG Example (Cont. ) 1 Fault activation 2 Path sensitization 3 Line justification D

ATPG Example (Cont. ) 1 Fault activation 2 Path sensitization 3 Line justification 1

ATPG Example (Cont. ) Backtrack 1 Fault activation 2 Path sensitization 3 Line justification

D-Algorithm (Roth 1967) n n n Use D-algebra Activate fault n Place a D or D at fault site n Justify all signals Repeatedly propagate D-chain toward POs through a gate n Justify all signals Backtrack if n A conflict occurs, or n All D-chains die Stop when n D or D at a PO, i. e. , test found, or n Search exhausted, no test possible Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 9

Example: Fault A sa 0 n 1 Step 1 – Fault activation – Set

Example Continued n Step 2 – D-Drive – Set f = 0 0 1

Example Continued n Step 3 – D-Drive – Set k = 1 1 D

Example Continued n Step 4 – Consistency – Set g = 1 1 1

Example Continued n Step 5 – Consistency – f = 0 Already set 1

Example Continued n Step 6 – Consistency – Set c = 0, Set e

Example: Test Found n n Step 7 – Consistency – Set B = 0

Podem (Goel, 1981) n n n Podem: Path oriented decision making Step 1: Define an objective (fault activation, D-drive, or line justification) Step 2: Backtrace from site of objective to PIs (use testability measures guidance) to determine a value for a PI Step 3: Simulate logic with new PI value n If objective not accomplished but is possible, then continue backtrace to another PI (step 2) n If objective accomplished and test not found, then define new objective (step 1) n If objective becomes impossible, try alternative backtrace (step 2) Use X-PATH-CHECK to test whether D-frontier still there – a path of X’s from a D-frontier to a PO must exist. Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 17

Podem Example 3. Logic simulation for A=0 2. Backtrace “A=0” 1. Objective “ 0”

Podem Example (Cont. ) 6. Logic simulation for A=0, B=0 5. Backtrace “B=0” 1. Objective “ 0” 0 0 0 S-a-1 0 (9, 2) 7. Objective possible but not accomplished Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 19

Podem Example (Cont. ) 9. Logic simulation for E=0 8. Backtrace “E=0” 1. Objective “ 0” 0 0 0 S-a-1 0 (9, 2) 10. Objective possible but not accomplished Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 20

Podem Example (Cont. ) 12. Logic simulation for D=0 1. Objective “ 0” 0

An ATPG System Random pattern generator Fault simulator yes Save patterns yes Fault coverage improved? no Random patterns effective? Deterministic ATPG (D-alg. no or Podem) Stop if fault coverage goal achieved Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 22

Summary n n Most combinational ATPG algorithms use D-algebra. D-Algorithm is a complete algorithm: n n Podem is also a complete algorithm: n n n Finds a test, or Determines the fault to be redundant Complexity is exponential in circuit size Works on primary inputs – search space is smaller than that of D-algorithm Exponential complexity, but several orders faster than Dalgorithm More efficient algorithms available – FAN, Socrates, etc. n See, M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer, 2000, Chapter 7. Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 23

Exercise 2: Lectures 4 -6 n For the circuit shown above n n n Determine SCOAP testability measures. Derive a test for the stuck-at-1 fault at the output of the AND gate. Using the parallel fault simulation algorithm, determine which of the four primary input faults are detectable by the test derived above. Copyright 2001, Agrawal & Bushnell Day-1 PM-3 Lecture 6 24

Exercise 2: Answers ■ SCOAP testability measures, (CC 0, CC 1) CO, are shown

Exercise 2: Answers Cont. ■ A test for the stuck-at-1 fault shown in the

Exercise 2: Answers Cont. ■ Parallel fault simulation of four PI faults is illustrated below. Fault PI 2 s-a-1 is detected by the 00 test input. 00100 00001 PI 2=0 No fault PI 1 s-a-0 PI 1 s-a-1 PI 2 s-a-0 PI 2 s-a-1 00001 Copyright 2001, Agrawal & Bushnell 00001 Day-1 PM-3 Lecture 6 PI 2 s-a-1 detected PI 1=0 27