STIL Support IMS Design and Test Software Oct

STIL Support IMS Design and Test Software, Oct 2002

SOC Device Tests Supported Today § § Functional tests - Digital patterns from Verilog testbenches like VCS - Analog tests are “handcrafted” by test department Structural tests - Scan based (Tetra. MAX Output) - Iddq - Digital (So. CBIST), Memory, Mixed-Signal BIST

IMS Short Term STIL Strategy § § Support STIL input for DFT flows - Full Language parser DFT data subset in practice CTL supported Input from all DFT tools Validate STIL output to 1450 spec standard - Support ATE-specific variants

The IMS Test. Developer Flow Functional (VCS) VCD Structural (Tetra. MAX) § § § Cyclize WGL Data base Tester Bridge Test PGM STIL Design simulation output must be timed and ATE optimized Structural and functional tests are combined into one test file A “Bridge” creates specific tester source data DESIGN TEST DEVELOPMENT TEST DEBUG IMS flow simplifies complex tasks Standardized process shortens test development time Supplements in-house resources

Supported ATE Product Families And Additional Tester Support in Development Advanced Test Development Test. Developer™ Ø Ø Ø Ø Ø Ando Advantest T 33 xx, T 66 xx, T 65 xx Agilent 83000, 94000 Credence SC, Duo/Quartet/Octet Teradyne J 750, J 971/3, A 5, Catalyst, Tiger IMS ATS, XTS, FT, Vanguard NPTest ITS 9000 LTX SZ Test Systeme M 3610, M 3650, Piranha, Falcon, Kodiak Test Debug on the Desktop Virtual. Tester™ Ø Ø Ø Ø Advantest T 3340, T 6600 Agilent 83000, 93000 Credence Kalos & Quartet/Octet Teradyne J 750, J 971/3, Catalyst/Tiger Versatest V 1000, V 1300 IMS Vanguard NPTest ITS 9000 SZ Test Systeme M 3650, Piranha, Falcon, Kodiak

STIL Test Construct Advantages § § Flexible Signal group and attribute definition Hierarchical and multi-track waveform tables Spec block & Selector block specifies min/typ/max, etc. Print-on-change pattern data - Compact pattern data character representation § § Match. Loop, Break. Point, Go. To, Iddq. Test. Point support § § Scan Structure efficiency using Procedures and Macros Pattern Exec & Control block to select from multiple timing and waveform blocks User-defined extensibility; User Keywords & User Functions

In Summary § § § Test. Developer delivers the flow to enable the current STIL efforts to be productive Test. Developer supports the complete (functional and structural) test pattern, timing and connectivity files for engineering and production test systems IMS Da. TS will continue its involvement in the STIL standards efforts