Standards Coordinating Committee 20 SCC 20 IEEE SCC
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Standards Coordinating Committee 20 SCC 20 IEEE SCC 20 Standards Status With emphasis on the IEEE-1671 (ATML) Series of Standards September 15, 2010 Mike Seavey SCC 20 Chair & 2010 Member of the IEEE Standards Board AUTOTESTCON 2010
ATS Elements Supported by the Automatic Test Markup Language (ATML) 2
ATML Framework and Sub Domains 3
ATS Sub Domains 4
Present ATML Series of Standards: IEEE-1671 ATML Overview and Architecture IEEE Std 1671 -2006 Full Use ATML: Test Description IEEE Std 1671. 1 -2009 Trial Use ATML: Instrument Description IEEE Std 1671. 2 -2008 Trial Use ATML: UUT Description IEEE Std 1671. 3 -2007 Full Use ATML: Test Configuration IEEE Std 1671. 4 -2007 Full Use ATML: Test Adapter IEEE Std 1671. 5 -2008 Trial Use ATML: Test Station IEEE Std 1671. 6 -2008 Trial Use SIMICA Standards: IEEE-1636 Software Interface to Maintenance Information Collection and Analysis IEEE Std 1636 -2008 Trial Use SIMICA: Test Results and Session Information IEEE Std 1636. 1 -2007 Trial Use SIMICA: Maintenance Action Information IEEE P 1636. 2 ----5
Some of the other SCC 20 Standards AI-ESTATE IEEE Std 1232 -2002 Full Use STD IEEE Std 1641 -2010 Full Use RFI IEEE Std 1505 -2006 Full Use • A revision to the Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) standard is in process. It will be submitted to the IEEE Standards Board for approval in the near future • A revision to the Receiver Fixture Interface (RFI) standard is on the IEEE Standards Board agenda for approval 6
IEEE Download site for IEEE-1671 Series XML Schemas 7
What’s on the Horizon ? • ATML Overview and Architecture – A revision to the 2006 publication (and associated XML schemas) has completed the IEEE ballot process – On the IEEE Standards Board agenda for approval – ~120 page document is now over 420 pages • Each of the IEEE-1671 “dot” Standards – Revisions to each of the six standards and their associated XML schemas will be made “simultaneously” • SIMICA – A revision to the Test Results (IEEE Std 1636. 1) publication (and associated XML schemas) has begun – IEEE-P 1636. 2 is on the IEEE Standards Board agenda for approval 8
