Standards and Measurement of LEDs and Solid State

光电系学术讲座 讲座 一: Standards and Measurement of LEDs and Solid State Lighting 报告时间： 2012年 9月17日（星期一）上午9: 30 – 10: 30 报告地点：玉泉校区教三440 演讲人：Dr Yoshi Ohno, 美国国家科学及技术研究所(NIST)光源及颜色组主任、国际照明委员会（CIE） 副总裁 摘要： Standards for solid state lighting measurement (international and USA) will be first overviewed, including CEN/CIE draft SSL test method, CIE 127 on low power LEDs, IES LM-79 for LED lamps and luminaires, LM-80 and TM-21 for lumen maintenance, LM-82 for light engines, LM-85 (draft) for high power LED packages, and ANSI C 78. 377 on chromaticity specification. Various measurement methods for LED components to LED luminaires will be presented based on these standards. Measurement methods include measurements of photometric quantities such as total luminous flux, luminous efficacy, luminous intensity distribution, as well as colorimetric quantities such as chromaticity x, y, u¹, v¹, correlated color temperature (CCT), Duv, and color rendering index (CRI). Some guidance on the use of integrating spheres, goniophotometers, and spectroradiometers, including various correction techniques, will also be presented. 演讲人简介： Yoshi Ohno is the Leader of Lighting and Colour Group in the Sensor Science Division of the National Institute of Standards and Technology Institute (NIST), USA. He has been actively involved in research pertaining to photometry and colorimetry. Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting. He is a Fellow of IESNA, currently serves as the Vice President of Technology (CIE), NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and active in technical committees in CIE, ISO, ANSI, and IESNA. Ohno received Arthur S. Flemming Award in 2006, CIE de Boer Gold Pin Distinguished Service Award in 2007, and U. S. Department of Commerce Silver Medal Award in 2009. 讲座 二: New method for high-accuracy calibration of optical sensors using a low-cost tunable k. Hz OPO laser system 报告时间： 2012年 9月17日（星期一） 10: 30 – 11: 30 报告地点：玉泉校区教三440 演讲人：Dr Yuqin Zong, Sensor Science Division, National Institute of Standards and Technology(NIST), USA 摘要： Continuous-wave (CW) and pulsed, mode-locked tunable lasers have been successfully used for calibration of optical sensors, especially for spectral irradiance and radiance responsivity, for many years at NIST and other National Metrology Institutes to achieve smallest calibration uncertainties. These tunable lasers, however, are expensive and difficult to automate; these characteristics limit their widespread use. To address these issues, a new method was developed recently at NIST for calibration of optical sensors using a low-cost, fully automated k. Hz pulsed tunable optical parametric oscillator (OPO) laser system with a continuously tunable range from 210 nm to 2400 nm. Unlike conventional methods, the new method is based on measurement of total energy of a pulsed OPO laser train using two synchronized current integrators (also called charge amplifiers) to obtain total integrated electric charges from a test detector or standard detector and a monitor detector, respectively. Extremely high measurement repeatability (10 ppm) is achieved by using this new method even though fluctuation of the OPO laser is approximately 10 %. Absolute expanded calibration uncertainty is estimated to be 0. 05 % (with a coverage factor of k = 2), which is virtually the same as that by using tunable CW lasers. The calibration method, the k. Hz OPO laser system, and various applications will be discussed. 演讲人简介： Yuqin Zong graduated in 1984 from the Department of Optical Engineering, Zhejiang University. He received his Master of Science degree in high-speed photography in 1987 from the Institute of Optics & Electronics, Chinese Academy of Sciences, Chengdu. From 1987 - 1994, he was with the Shanghai Institute of Technical Physics, Chinese Academy of Sciences, working on meteorological satellite projects. Currently Yuqin is an electronics engineer at the Sensor Science Division, Physical Measurement Laboratory, National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, USA. His job responsibility includes realization and maintenance of the NIST photometry and colorimetry scales and providing calibration services to the industry. His research covers areas such as stray-light correction for array spectrometers and imaging instruments, measurement of high-power LEDs and solid-state lighting (SSL) products, and calibration of detectors using tunable lasers Yuqin is the chairman of technical committee TC 2 -63 of the International Commission on Illumination (CIE) for Optical Measurement of High-Power LEDs. He is also the chairman of the working group of the Illuminating Engineering Society (IES) for measurement of AC LEDs. 欢迎广大师生参加！