Secondary Ion Mass Spectroscopy & Mass Spectroscopy 원리 반도체 및 나노 응용 연구실 발표자: 이성우
Outline l l l 개략도 SIMS의 종류 MS MS의 분석 방법 l l l Primary ion beam source 질량 분석기의 종류 SIMS / MS 장, 단점
Sims / Ms Spectroscopy 개략도 Sample Ion source • Ar • Xe • N 2 • Cs+ Mass Spectroscopy • TOF • Quadrupole • Magneticsector Detector • Micro-channel Plate • Electron Multiplier • Faraday cup • PEM Data System • PC’s
Dynamic SIMS Secondary ion counts A silicon sample containing a boron implant (secondary ion intensity versus sputtering) Times (sec)
Static SIMS Negative mass spectrum from polyphenylene sulfide
Static SIMS Positive mass spectrum from polyethylene
Primary ion beam source Ø Source 주로 비활성기체를 사용 Positive charged ions (Ar+, Xe+) Negative charged ions (Ar , Xe) or N 2+, O 2+ , Cs+등을 사용