Secondary Ion Mass Spectroscopy Mass Spectroscopy Outline l

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Secondary Ion Mass Spectroscopy & Mass Spectroscopy 원리 반도체 및 나노 응용 연구실 발표자:

Secondary Ion Mass Spectroscopy & Mass Spectroscopy 원리 반도체 및 나노 응용 연구실 발표자: 이성우

Outline l l l 개략도 SIMS의 종류 MS MS의 분석 방법 l l l

Outline l l l 개략도 SIMS의 종류 MS MS의 분석 방법 l l l Primary ion beam source 질량 분석기의 종류 SIMS / MS 장, 단점

Sims / Ms Spectroscopy 개략도 Sample Ion source • Ar • Xe • N

Sims / Ms Spectroscopy 개략도 Sample Ion source • Ar • Xe • N 2 • Cs+ Mass Spectroscopy • TOF • Quadrupole • Magneticsector Detector • Micro-channel Plate • Electron Multiplier • Faraday cup • PEM Data System • PC’s

Dynamic SIMS Secondary ion counts A silicon sample containing a boron implant (secondary ion

Dynamic SIMS Secondary ion counts A silicon sample containing a boron implant (secondary ion intensity versus sputtering) Times (sec)

Static SIMS Negative mass spectrum from polyphenylene sulfide

Static SIMS Negative mass spectrum from polyphenylene sulfide

Static SIMS Positive mass spectrum from polyethylene

Static SIMS Positive mass spectrum from polyethylene

Primary ion beam source Ø Source 주로 비활성기체를 사용 Positive charged ions (Ar+, Xe+)

Primary ion beam source Ø Source 주로 비활성기체를 사용 Positive charged ions (Ar+, Xe+) Negative charged ions (Ar , Xe) or N 2+, O 2+ , Cs+등을 사용