Road. Map of Technology Semiconductor technology Parameter extraction Device fab. Semiconductor physics Device modelling Integrated circuit Device physics Device simulation Physical model Electrical model
CMOS device
CMOS Technology for 25 nm Channel Length
Quantum computer device
Contents n p-n junction n Bipolar Junction Transistor n JFET&MESFET (includes M-S junction) n Metal-Oxide-Semiconductor Transistor n Other Semiconductor Device
Ch 1 Semiconductor Introduction n Semiconductor material & Carrier model n Lattice Vibration n Carrier Transport Phenomena n Optical Properties of Semiconductor
1. 1 半导体材料和载流子模型 Crystalline, Polycrystalline, Amorphous n Solids Metal, Semiconductor, Insulator n Semiconductor generations Material — three
First generation单晶硅棒
First Generation硅单晶片
Second Generation Ga. As晶圆片
Third Generation:Si. C,Ga. N
1. 1. 1 Crystal Structure介绍 n Unit Cell(元胞) Three Dimensional: Diamond: Ge, Si Zincblende: Ga. As n Lattice Constant:原子平衡间距 n Miller Indices和晶向,晶面:比如(100) 晶面,与之垂直的称为[100]晶向
Question Continue
Question continue n Si晶格常数a. Si: 5. 431Å n Ge晶格常数a. Ge: 5. 658Å>Si晶格常数 n Si 1 -x. Gex晶格常数a. Si. Ge计算公式: n a. Si. Ge=a. Si+(a. Ge-a. Si)x=a. Si+0. 0227 x n x称为百分含量
测量结果 n Strained: Eg(x)=1. 12 -0. 74 x(x为Ge百分 含量) n Eg=0. 74 x
Derivation of Density-of-State → →
Derivation of Density-of-State ↓
1. 1. 3 Carrier Concentration Density-of-State function gc(E) n Distribution function f(E) n Electron Concentration(单位体积的电子数) : n
Carrier Concentration n 将n p, 得 Intrinsic carrier density is · ni~T
Carrier Concentration n —intrinsic Si n=p=ni n —n-Si electrons are “donated” to the conduction band(“donor”) n —p-Si: “hole”s are created in the valence band
Carrier Concentration n Q 6:已知:Si,ni,ND,全电离,Eg,T 请计算EF与Ei,EC,EV的能量差。