Revolution in RF Test Formula Lite Point Black

Who is Lite. Point Confidential 2

• Lite. Point is Lite. Point Confidential 3

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Lite. Point Delivers… Innovation at the Intersection of Wireless Technology and Mass Production Source: Earth 911, Info Dingo Lite. Point Confidential

Tablets Smart Appliances Smart Phones Consumer Electronics Companies Audio & Video Manufacturers Lite. Point Consumer Electronics Smart Appliances Smart Power Grid Chipset Makers Billions of Devices Consumer Electronics Lite. Point Confidential

What Lite. Point matters with you --Speed to Market & Cost Savings Lite. Point Confidential

To Market Innovation Drives Speed to Market Lite. Point Confidential Lightning. Fast Test Times Fast Implementation VS Ease of Use VS VS

Maximize Lifetime Value ue l a V OPERATING EXPENSES Lite. Point Confidential THROUGHPUT e m i r. T e v O TIME TO MARKET

Quality Don’t Sacrifice Quality Lite. Point Competitors Throughput Lite. Point Confidential

Why Lite. Point -- Formular Lite. Point Confidential 12 12

#1 Cellular multi-DUT Parallel Tester – Y 2011 First Parallel Testing Solution Lite. Point Confidential 13

Utilization Maximizing Technology (UMT) • Smart Multi-DUT Testing Architecture - Optimized resource usage – best utilization - Optimized hardware and software integration – highest throughput • Key Elements - Dynamic Signal Control (DSC) - Intelligent Signal Processing - Smart Data Export Built in Calibration Point to Point Connections Synchronized Dynamic Reference Level Control Captures Per DUT Signal Detection Dynamic Signal Control DUTs Lite. Point Confidential Parallel Processing Pipelined Data Transfer Data Capture Smart Data Export Data Processing Data Export

Multi-Channel Measurement Architecture Traditional Test Architecture supports only one measurement at a time PWR EVM setup measure ACLR setup measure fetch OBW setup measure fetch IQxstream Architecture Multiple instrument channels support multiple, simultaneous measurements setup … setup Lite. Point Confidential PWR Data EVM Data OBW Data ACLR Data Capture 15

Better Test Coverage, Less Test Time W-CDMA TX test example Power Level 1 ILPC ACLR EVM Power Level 2 I/Q Imb. ACLR EVM I/Q Imb. Time I/Q Imb. ACLR I/Q Imb. EVM Power Level (d. Bm) EVM LR AC ce M lan a EV b Im I/Q ACLR ce M lan a EV b Im CLR A I/Q nce M ala EV b Im I/Q … ACLR ILPC Lite. Point Confidential Time Slot 16

Sequence-Based Test Programming Traditional Methods require sending instructions to (“setup”) the DUT at the beginning of each measurement in a series of tests Test Time Traditional Non-Signaling DUT + TE setup meas #1 TE setup meas #2 meas #3 TE setup meas #N IQxstream Method: pre-program a “sequence” (several SCPI commands) only once IQxstream and then execute many times with one command Sequence Based Non-Signaling DUT setup meas #1 meas #2 meas #3 Execute test sequence Load the test sequence Lite. Point Confidential 17

IQxstream Enables Fastest Throughput Tester “x” 1 DUT signaling IQxstream 1 DUT non-signaling IQxstream 4 DUT non-signaling Test Speed >2 X Improvement Test Speed >6 X Improvement 6 X More Throughput! Lite. Point Confidential 18

Throughput -- more than RF Test Speed Lite. Point Confidential 19 19

Offering Flexibility in Manufacturing (And a smooth transition to automated, multi-DUT testing) Automated Loading / Panel Test Manual Loading 1 -DUT Sequential (1 x 1 ping-pong) Multi-DUT Asynchronous (4 devices in semi-parallel) Multi-DUT Synchronous (4 devices in 1 chamber) Now When you’re ready 2013 and before Lite. Point Confidential 20

Why Does APT Work? (Example: TX Calibration) 1 -DUT 0% DUT control, settling time, NV write 70% Idle 30% Utilized 2 -DUT 0% 60% Utilized 3 -DUT 40% Idle 0% 90% Utilized 4 -DUT 0% 100% Nearly 100% Utilized Lite. Point Confidential 100%

APT Integration Requirements • Lite. Point APT easily Pn. P in any ATE SW with minimal changes required • Keys: 1. “Turn off” tester when DUT fails 2. “Turn off” tester when DUT passes 3. “Turn off” tester when DUT finishes (before NVs written) • Upper S/W layer does not need to be: 1. “Multi-DUT aware” – just starts multiple 1 -DUT programs 2. Aware of any other DUT program – all handled through in-box tokens 3. Thread safe Zero Risk to any ATE SW Lite. Point Confidential

Maximum performance using APT Asynchronous Parallel Test drivers benefits • Application side driver is written as a single threaded driver • No shared memory, or application side synchronization required • Works with 1 – …n DUT’s. • Plugs into existing API’s from any test framework without any architecture changes required. • Maximum performance achieved with simple API call to turn off the Generator when testing is completed. (Pass, Fail, Abort, Prior to NVM) • Works for both calibration and verification • Common core driver can operate in multiple modes of operation • Exclusive Resource • Maximum distribution • Shared Resource • Cadence Enforced Mode ( CEM-1, CEM-2, CEM-4) • CEM-1 = 1 x 1 x 1 • CEM-2 = 1 x 2 x 2 • CEM-4 = 1 x 4 Lite. Point Confidential •

“Asynchronous” Does Not Mean “Chaotic” • New token priority system helps manage asynchronous test processes • Key benefits: - Ensures maximum operator efficiency in the factory – minimal idle time - Asynchronous processes do not need to be aware of other processes Unmanaged Asynchronous Processes Maximum Asynchronous Distribution DUT #1 DUT #2 DUT #3 DUT #4 Time Lite. Point Confidential

Synchronizing Asynchronous Processes How do we go from: Here …to here? DUT #1 DUT #2 DUT #3 DUT #4 Asynchronous Lite. Point Confidential DUT #3 DUT #4 Synchronous

Combining APT & SPT • By leveraging token prioritization, the test program can automatically align multiple asynchronous processes • Key benefits: - Same operational benefit of APT, and eliminates wait time between Cal and Ver - Again, asynchronous processes do not need to be aware of other processes Asynchronous Processes Synchronous Processes DUT #1 DUT #2 DUT #3 DUT #4 Time Lite. Point Confidential

Technology Trends: Multi-DUT and Panel Test 4 / 8 DUT, Asynchronous & Synchronous Parallel Test 1 -DUT / Ping-Pong 4 / 8 -DUT Asynchronous 4 / 8 -DUT Synchronous Lite. Point Confidential 27

Lite. Point – Continuous Throughput Improvement Throughput Test innovation enabled through close cooperation with chipset providers and OEMs • 4 / 8 DUT Parallel Test (Wi. Fi / BT) IQxel-M • First in Multi-DUT Parallel Test (2 G/3 G/4 G) IQxstream • MPS IQ 2010 2008 Lite. Point Confidential • FAST PER 2011 2013 2014 28

Concurrent Test vs. Serial Test Traditional approaches test multiple radios serially (“one at a time”) Wi. Fi Bluetooth® GPS / GNSS Serial testing requires long test times FM Serial Tester Wi. Fi BT GPS GN SS FM Test time IQxel-M offers concurrent testing of multiple radios Wi. Fi Bluetooth® GPS/GNSS FM Wi. Fi GPS FM BT GN SS Concurrent testing Significantly reduces test time Up to 50% Test time * DUT O/S must support concurrent test Lite. Point Confidential 29

Multi-DUT Configuration Connectivity VSG Signal Routing Connectivity VSA Broadcast VSG Navigation VSG • Example set up of 4 smart phones for WLAN/BT, GPS / GLONASS and FM test Lite. Point Confidential 30

Flexible Multi-DUT Testing Manual Loading Automated Loading 1 -DUT Sequential (1 x 1 ping-pong) Multi-DUT Asynchronous (4 devices in semi-parallel) Multi-DUT Synchronous (4 devices in full parallel) Now When you’re ready 2013 and before a smooth transition to automated, multi-DUT testing Lite. Point Confidential 31

Formula Lite. Point – Real Cases Lite. Point Confidential 32 32

META Turbo for MTK Fromula Lite. Point DUT Lite. Point Confidential DUT 1 DUT 2 DUT 3 DUT 4 33

CFT Turbo for Spread. Trum Fromula Lite. Point DUT Lite. Point Confidential DUT 1 DUT 2 DUT 3 DUT 4 34

META Turbo Promotion Cal + Verf，MTK ATE GSM 3 bands，WCDMA 2 bands Boot up 148 s Test time/DUT 25 s 104 s Test Time 25 s 55 s 123 s 81 s 55 s *Turbo approcah hide all boot up time cost UPH: 1. 7 x higher Same Tool, same operation Less stations, operators, and PCs. UPH 2. 7 1. 0 1. 4 65 pcs 24 pcs AG 8960 (1 -DUT) Lite. Point Confidential 34 pcs IQXS (1 -DUT) IQXS (4 -DUT) 35

Before: you have to Many manufacturers still rely on stacks of large outdated devices, that are expensive and hard to manage. Lite. Point Confidential 36

Today: You and Lite. Point Confidential 37 37

Providing Best Test Economics Focus on the problem - Purpose-built for manufacturing to achieve lowest test cost, highest reliability, and best test yield - Operational innovation through Continuity Fault Detection and automated path loss calibration Minimize test costs – maximize product quality - Reduce test times while increasing test coverage Pioneering multi-DUT test - Maximizing parallelism with minimal resource idle time - Future-looking test techniques with concurrent test engines Support - Providing wireless measurement expertise – not just instrument support - Providing total chipset solutions, enabling optimal performance Lite. Point Confidential 38

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