Recap In the last video conference0328 we discussed

Recap… * In the last video conference(03/28), we discussed mostly SEM and AFM results taken on samples 398 and 396 and effect of nucleation pre-treatment. * SEM results on sample 396 shows that the top surface has some gaps and is not continuous at some point. Today’s Presentation: * With reference to some anomaly observed on sample 396, we did Auger measurement on top and bottom surface of sample 396 and found that top surface of sample 396 is graphitic in nature, which is in contrast to other sample studies so far(398 and 5%UNCD) except sample 147, which also shows similar graphitic signature on the top surface. *We will discuss the reasons behind such anomalies observed.

Top Surface: Sample 396

Sample 398: Top Surface

Top Surface: Sample 396(survey scan)

Bottom Surface: Sample 396

Bottom Surface: Sample 396(survey scan)

Bottom Surface: Sample 396(XPS survey scan)

Top Surface: Sample 147

Observations: *Auger scan taken on sample 396 and 147 shows that their top surface is graphitic. The SEM images taken on these samples also shows same “dirty” nature. The graphitic nature observed on sample 396 may be related to its nucleation process anomaly indicated by Jenny. *Auger scan taken on Sample 398 top surface shows true diamond signature. *Sample grown on Si. O 2 shows less or almost negligible amount of Si on the back side as Compared to samples grown on Si. *A sample with conditions similar to 396 should be grown again and needs to be tested by Auger.