Radiation damage in silicon detectors Radiation damage in

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Radiation damage in silicon detectors

Radiation damage in silicon detectors

Radiation damage in silicon detectors

Radiation damage in silicon detectors

Radiation damage in silicon detectors

Radiation damage in silicon detectors

Radiation damage in silicon detectors:

Radiation damage in silicon detectors:

Outline________________ • Introduction • Radiation damage • How do we study it • Effects

Outline________________ • Introduction • Radiation damage • How do we study it • Effects • Conclusions 1

Introduction______________ • High demanding radiation environment • Need to understand how radiation damage affects

Introduction______________ • High demanding radiation environment • Need to understand how radiation damage affects detector performance 2

Displacement damage__________ • Displacements of atoms • Defects in the lattice • Creates energy

Displacement damage__________ • Displacements of atoms • Defects in the lattice • Creates energy levels in the band gap • The new levels can act as traps Conduction band Valence band 3

How do we study it___________ • Irradiation up to very high radiation fluecens •

How do we study it___________ • Irradiation up to very high radiation fluecens • Protons and neutrons • Measurements of parameters as leakage current, depletion depth, etc 4

Effects of displacement damage______ • Increased leakage current, due to levels in the band

Effects of displacement damage______ • Increased leakage current, due to levels in the band gap • Increased noise • Acceptor removal • Effective doping concentration of the substrate decreases • Depletion region increases 5

Ionizing damage____________ • Defects in the silicon oxide • Fixed positive charge near the

Ionizing damage____________ • Defects in the silicon oxide • Fixed positive charge near the interface • Changes the functionality of components 6

How do we study it___________ • Gamma ray irradiation of test-chips • Photons of

How do we study it___________ • Gamma ray irradiation of test-chips • Photons of different energy and dose specification • Measurement of electrical parameters: • • Leakage current Transistors characteristics Capacitance Cross-talk 7

Effects of ionizing damage________ • Due to fixed positive charge in the oxide layer,

Effects of ionizing damage________ • Due to fixed positive charge in the oxide layer, electrons are accumulating on the interface • Increase in the leakage current • Change of transistor threshold voltage 8

Conclusion______________ _ Design Simulate 9

Conclusion______________ _ Design Simulate 9

Conclusion______________ _ Design Simulate Measure 9

Conclusion______________ _ Design Simulate Measure 9

Conclusion______________ _ Design Simulate Measure 9

Conclusion______________ _ Design Simulate Measure 9

Silicon detectors basics • P-N junction is the basic element of a particle detector:

Silicon detectors basics • P-N junction is the basic element of a particle detector: • Charge carriers move into the junction and recombine • Electric field induced inside this depleted region • Distinguish 2 energy bands: • Valence band: electrons bounded in the Si atom • Conduction band: electrons moving freely through the sensor Noise! • Electrons can be thermally excited from the valence to the conduction band Leakage current • Leakage current highly reduced in the depletion region due to absence of charge carriers Sensitive part of the sensor