Multi View 1000 Product Presentation Nanonics Multi View

Multi. View 1000™ Product Presentation Nanonics Multi. View 1000™

Multi. View 1000™ Product Presentation Multi. View 1000 ™ Complete System

Multi. View 1000™ Product Presentation Modes of Operation SPM modes: • AFM contact • AFM Intermittent contact mode • STM • Electrical Measurements Near Field Modes (NSOM): • Reflection • Transmission • Collection • Fluorescence • Photo-Luminescence Far Field Methods: • Standard Microscope Imaging • Fluorescence • Confocal

Multi. View 1000™ Modes of Operation Product Presentation Enabled by patented 3 D- Flat. Scan. TM Technology & Cantilevered NSOM/AFM probes

Multi. View 1000™ Easy Integration with Optical Microscopes Product Presentation Dual - Upright /Inverted Optical Microscope

Multi. View 1000™ Multi. View 1000 ™ fits any Optical Microscope Product Presentation Olympus Inverted Zeiss Dual Olympus Dual Zeiss Upright

Multi. View 1000™ Product Presentation Illumination Sources Fiber coupler and laser Illumination through the fiber using a Fiber Coupler • Nd-YAG Laser (532 nm) • Ar+-Laser (488 & 515 nm) • He. Cd-Laser (325 nm) • Diode Laser (Vis – IR) • Femtosecond Laser

Multi. View 1000™ Product Presentation Detection System Reflection mode detector Transmission mode detector Detectors on the Microscope ports • APD (Vis) • PMT (UV – VIS) • In. Ga. As (IR) • Fiber adapter for the connection to a Spectrometer or Monochromator • …

Multi. View 1000™ Product Presentation Normal Force Feedback • Standard AFM and cantilevered NSOM probes • Easy to use - standard beam-bounce feedback • All standard AFM imaging modes available • Free optical axis above and below

Multi. View 1000™ Standard NSOM/SPM Technology Product Presentation Cylindrical Piezo Probe is not Optical, micro. Raman or Electron/Ion Beam Friendly neither from the top nor bottom

Multi. View 1000™ The Multi. View 1000 ™ Technology Product Presentation Flat Scanner Probe is Optical, micro. Raman or Electron/Ion Beam Friendly from the top and the bottom

Multi. View 1000™ Product Presentation Nanonics 3 D-Flatscan™ • Only 7 mm thick • 70 mm X-Y-Z scan range • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

Multi. View 1000™ Product Presentation Nanonics 3 D-Flatscan™ with Closed Loop Sensors Nanonics 3 D-Flatscan ™ with X-Y closed loop sensors • Capacitive displacement sensors • Precise positioning and scanning • Additional Z-sensor available • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

Multi. View 1000™ Product Presentation Magnetic tip placement • Easy & repeatable magnetic tip mounting • Easy magnetic attachment of the mount to the scan head • Large selection of specialized tips • Non-magnet holders available

Multi. View 1000™ Product Presentation Sample Scanning Confocal Imaging • Illumination: Through Eyepiece • Detection: on Microscope port • Scanning: 3 D-Flatscan™