MEMS CLEAN ROOM n 1500 m 2 class

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MEMS CLEAN ROOM n 1500 m 2, class 10 n 150 mm (6”) Wafer

MEMS CLEAN ROOM n 1500 m 2, class 10 n 150 mm (6”) Wafer line n 3 shift preparation for R&D and pilot fabrication (24 x 5) n Access to external services n Technological parameter supervising system n MES / PPS based planning and documentation n ISO 9001 certification © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 1

MEMS Clean Room Layout Aktuelle Clusterung SEM BACK END CHARACTERIZATION & TEST WET ETCH

MEMS Clean Room Layout Aktuelle Clusterung SEM BACK END CHARACTERIZATION & TEST WET ETCH / CLEANING LAB INLINE METROLOGY BACK END CVD LOGISTICS HIGH TEMPERATURE EXTERNAL PARTNERS LITHOGRAPHY DRY ETCH / PVD GOWNING AREA CMP © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 2

MEMS Clean Room: Characterization & Test © Fraunhofer IPMS T. Zarbock I 05. 04.

MEMS Clean Room: Characterization & Test © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 3

MEMS Clean Room: Lithography © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I

MEMS Clean Room: Lithography © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 4

MEMS Clean Room: Wet Etch / Cleaning © Fraunhofer IPMS T. Zarbock I 05.

MEMS Clean Room: Wet Etch / Cleaning © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 5

MEMS Clean Room: Wet Etch / Cleaning © Fraunhofer IPMS T. Zarbock I 05.

MEMS Clean Room: Wet Etch / Cleaning © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 6

MEMS Clean Room: Dry Etch / Strip Resist © Fraunhofer IPMS T. Zarbock I

MEMS Clean Room: Dry Etch / Strip Resist © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 7

MEMS Clean Room: Backend (Bonding, Dispense) © Fraunhofer IPMS T. Zarbock I 05. 04.

MEMS Clean Room: Backend (Bonding, Dispense) © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 8

MEMS Clean Room: Inline Metrology © Fraunhofer IPMS T. Zarbock I 05. 04. 2013

MEMS Clean Room: Inline Metrology © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 9

MEMS Clean Room: Inline Metrology © Fraunhofer IPMS T. Zarbock I 05. 04. 2013

MEMS Clean Room: Inline Metrology © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 10

MEMS Clean Room: SEM © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I

MEMS Clean Room: SEM © Fraunhofer IPMS T. Zarbock I 05. 04. 2013 I slide 11