Low Voltage Sequential Circuit With a Ring Oscillator

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Low Voltage Sequential Circuit With a Ring Oscillator Clock ELEC 6270 Low power design

Low Voltage Sequential Circuit With a Ring Oscillator Clock ELEC 6270 Low power design of Electronic Circuits Spring, 2009 Presented by Mridula Allani Under the guidance of Dr. Vishwani Agrawal

Dynamic Voltage and Frequency Scaling • Power Dissipation in electronic circuits. • The total

Dynamic Voltage and Frequency Scaling • Power Dissipation in electronic circuits. • The total power dissipation varies linearly with clock frequency and quadratically with supply voltage. • In idle periods a microprocessor is optimized to run at a lowvoltage and less than maximum speed to save power. • Generally, a power management unit controls this operation and reduces the Vdd and fclk after detecting an idle state. • Having an internally generated clock for such designs will decrease the burden on the power-management unit and save clock power. 2

Globally Asynchronous and Locally Synchronous Architecture Sequential Asynchronous Protocol Driven Communication Clock Generator •

Globally Asynchronous and Locally Synchronous Architecture Sequential Asynchronous Protocol Driven Communication Clock Generator • Power dissipation due to clock (appx. 40% of total) can be reduced using such architecture by designing clocks suitable for the local logic blocks. 3

Project Overview In_reg 1 clear count_enable Sequence Generator (Binary Counter) In_reg 2 Input Registers

Project Overview In_reg 1 clear count_enable Sequence Generator (Binary Counter) In_reg 2 Input Registers Combinational Logic (Ripple Adder) Output Registers sum_out cry_in set Ring Oscillator ring_clock Clock Distribution Network ENTITY local_synch IS PORT (set, clear, count_enable: IN STD_LOGIC; cry_out : OUT STD_LOGIC; sum_out: OUT STD_LOGIC_VECTOR( 3 DOWNTO 0 )); END local_synch; 4

Design Considerations • Ripple adder critical path delay = clock period of the ring

Design Considerations • Ripple adder critical path delay = clock period of the ring oscillator. Td = n*(tp. HL + tp. LH) = 1/fclk tp. HL, tp. LH respectively are the fall and rise times of a single inverter Td critical delay of the ripple adder n = number of inverters in a ring oscillator and is odd fclk frequency of the ring oscillator • Assume the propagation delay for the high-to-low or low-to-high transitions of an inverter to be equal. tp. HL + tp. LH = 2*Tinv Td = n* 2*Tinv = 1/fclk Tinv is the inverter delay • Delays are calculated as the time between the 50% point of the input waveform and the 50% point of the output waveform. 5

Objectives • Design a ring oscillator clock to meet the critical path delay of

Objectives • Design a ring oscillator clock to meet the critical path delay of the ripple adder. • Observe the variation in clock frequency of the ring oscillator with supply voltage and compare with theoretical values. • Design a clock distribution network to distribute the clock generated by ring oscillator. • Design a binary counter to supply input vectors to the ripple adder. • Observe the variation of the average and peak powers and the delay of the complete system with supply voltage. • Find the optimum operation condition for the system from the power delay product. 6

Tools Used • Model. Sim SE for behavioral modeling of the blocks. • Leonardo

Tools Used • Model. Sim SE for behavioral modeling of the blocks. • Leonardo Spectrum for gate-level synthesis. • Design Architect for transistor-level synthesis. • Eldo Spice for voltage, delay, power and critical path delay. • ADK tsmc 018 technology file for 0. 18 um models. 7

Experimental Results • Schematic Diagram of the Whole System 8

Experimental Results • Schematic Diagram of the Whole System 8

Experimental Results • Inverter Average Power (u. W) Maximum Voltage (V) Power (u. W)

Experimental Results • Inverter Average Power (u. W) Maximum Voltage (V) Power (u. W) • Ring Oscillator Delay(ps) Average Energy = Power Maximum Power / (u. W) Power Delay(ns Clock Energy* Voltage Clock (u. W) frequenc Delay(E(V) Frequency ) (GHz) y(f. J) 24 Js) 1. 8 36. 2283 134. 6928 10. 66338 1. 6 25. 3686 95. 0667 12. 91967 1. 4 17. 1228 54. 9572 17. 03383 1. 2 11. 5631 37. 004 23. 38268 1. 0 7. 9412 23. 5385 31. 57895 0. 8 7. 9287 23. 8102 55. 85586 0. 6 6. 211 8. 1721 128. 6984 0. 4 3. 0039 0. 194451 400. 7 0. 4 0. 274565 0. 000531 395541. 6 0. 2 1. 8 0. 5588 321. 4063 413. 1771 1. 78947 575. 172 1029. 21 1. 6 0. 5071 216. 509 1. 4 0. 4107 287. 3531 1. 97193 426. 955 841. 913 797. 456 134. 5032 182. 2995 2. 435 327. 497 3 1. 2 0. 33023 73. 6066 1. 0 0. 8 0. 6 109. 5668 3. 02817 222. 895 674. 948 151. 479 0. 2212 33. 5073 63. 5944 4. 5211 7 684. 855 892. 950 0. 1055 9. 9393 20. 1049 9. 4782 94. 211 7 3201. 91 0. 0168 0. 9035546 7. 8281 59. 5348 53. 783 78 50916. 0 4. 842 E-04 0. 0119375 0. 117383 2065. 22 24. 654 75 4. 54174 E 178260. 1443163. 5. 61 E-06 05 0. 000355 87 8. 0958 144 9

Experimental Results 3500 Energy*Delay (Ring Oscillator ) 3000 2500 2000 Energy*Delay (Ring Oscillator )

Experimental Results 3500 Energy*Delay (Ring Oscillator ) 3000 2500 2000 Energy*Delay (Ring Oscillator ) 1500 1000 500 0 0 0. 2 0. 4 0. 6 0. 8 1 1. 2 1. 4 1. 6 1. 8 2 • From the graph, the optimum operation point is at VDD = 1 V. 10

Theoretical Verification of Dependence of Voltage Scaling on the Frequency of Ring Oscillator •

Theoretical Verification of Dependence of Voltage Scaling on the Frequency of Ring Oscillator • Variation of frequency with the supply voltage is given by the αpower law, given by (VDD – Vth)α f =k × ─────── α VDD • VDD is the supply voltage, Vth is the zero-bias threshold voltage, f is the clock frequency, k and α are constants. • Typical Vth for 0. 18 um technology is 0. 3932 V. • ‘k’ and ‘α’ are calculated from the VDD and f values obtained for 1. 8 V and 1. 6 V supply voltage experimentally. • k = 1. 097 G and α = 2. 74 11

Comparison of Observed and Calculated Frequencies of Ring Oscillator • The experimental results obtained

Comparison of Observed and Calculated Frequencies of Ring Oscillator • The experimental results obtained for the remaining voltage 1. 4 V to 0. 2 V in steps of 0. 2 V are compared to theoretical results and are tabulated as follows. Observed Clock Frequency Theoretical Clock Frequency. Voltage (V) (GHz) 1. 4 0. 4107 0. 4445 1. 2 0. 33023 0. 3697 1. 0 0. 2212 0. 2791 0. 8 0. 1055 0. 1720 0. 6 0. 0168 0. 0593 0. 4 4. 842 E-04 0. 1555 E-04 0. 2 5. 61 E-06 undefined • We observe that the calculated frequencies are found to be close to theoretical results in almost all cases, but do not match the observed frequencies near and below threshold 12 voltages.

Experimental Results • Complete System • Ripple Adder Voltage (V) Average Maximu Power m

Experimental Results • Complete System • Ripple Adder Voltage (V) Average Maximu Power m Power Critical Average (u. W) Delay(ns) Power*Del ay 1. 8 6. 284 928. 2791 1. 0781 6. 775 1. 6 4. 8427 636. 8054 1. 24825 6. 045 1. 4 3. 5987 413. 6859 1. 51913 5. 467 1. 2 2. 5949 272. 8673 2. 00965 5. 2148 1. 0 1. 7407 179. 5037 3. 02571 5. 2668 0. 8 1. 0849 56. 7458 6. 19 6. 7155 0. 6 0. 562447 16. 7108 35. 187 19. 79 0. 4 0. 031435 0. 431696 1456. 19 0. 2 0. 000582 0. 001475 105682. 1 Clock Average Voltage (V) Frequency Power (u. W) (GHz) 1. 8 0. 5588 1. 6 0. 5071 1. 4 0. 4107 1. 2 0. 33023 1. 0 0. 2212 0. 8 0. 1055 0. 6 0. 0168 45. 775 0. 4 4. 842 E-04 61. 506 0. 2 5. 61 E-06 Maximum Power Critical (u. W) Delay(ns) Critical Delay of Ripple Adder(ns) 13

Experimental Results 70 Power*Delay (Ripple Carry Adder) 60 50 40 Power*Delay (Ripple Carry Adder)

Experimental Results 70 Power*Delay (Ripple Carry Adder) 60 50 40 Power*Delay (Ripple Carry Adder) 30 20 10 0 0 0. 2 0. 4 0. 6 0. 8 1 1. 2 1. 4 1. 6 1. 8 2 • From the graph, the optimum operation point is at VDD = 1 V. 14

Conclusions • The power-delay product of the ring oscillator was monotonically decreasing, but its

Conclusions • The power-delay product of the ring oscillator was monotonically decreasing, but its energydelay product had a minimum at 1 V supply voltage. • The power-delay product of ripple carry adder is minimum at 1 V supply voltage. • Thus, VDD = 1 V is the optimum supply voltage. • The whole system could not be simulated due to convergence errors in ELDO. 15

Future Work • The convergence errors need to be resolved. • This experiment has

Future Work • The convergence errors need to be resolved. • This experiment has to be repeated for high leakage technologies and similar trends need to be compared. 16

References • Dr Agrawal’s class slides for ELEC 6270, Spring 2009. • Power Management

References • Dr Agrawal’s class slides for ELEC 6270, Spring 2009. • Power Management and Dynamic Voltage Scaling: Myths and Facts, David Snowdon, Sergio Ruocco and Gernot Heiser • A Deterministic Globally Asynchronous Locally Synchronous Microprocessor Architecture, Matthew Heath and Ian Harris • http: //www. wikipedia. org/ 17