Low Frequency Characteristics of JFETs Low Frequency Characteristics

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Low Frequency Characteristics of JFETs Low Frequency Characteristics of Junction Field Effect Transistors Electronic

Low Frequency Characteristics of JFETs Low Frequency Characteristics of Junction Field Effect Transistors Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs • Junction FET (JFET) one form of an FET

Low Frequency Characteristics of JFETs • Junction FET (JFET) one form of an FET transistor Ø Ø Voltage-variable depletion width used to control transistor operation Causes pinch-off and device saturation Exhibits both a linear and saturated I-V characteristic Small signal operation modeled by transconductance and shunt resistance in pinched-off mode of operation Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs Variation of depletion width across JFET channel (a) and

Low Frequency Characteristics of JFETs Variation of depletion width across JFET channel (a) and current-voltage characteristics versus gate voltage (b). Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs 2 N 5485 n-channel JFET IDS-VDS characteristics (upper left),

Low Frequency Characteristics of JFETs 2 N 5485 n-channel JFET IDS-VDS characteristics (upper left), inputoutput characteristic (i. D(sat. ) vs v. GS) of a JFET (upper right), and small signal model of a JFET in pinched off mode of operation (bottom). Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs Measurements: 1) ID(Sat. ) = IDSS(1+VGS/VP)2 2) VP =

Low Frequency Characteristics of JFETs Measurements: 1) ID(Sat. ) = IDSS(1+VGS/VP)2 2) VP = -VGS + VDS(Sat. ) 3) gm = Δi. D/ΔνGS (νDS = const. ) 4) rd = ΔνDS/Δi. D (νGS = const. ) Experimental values for Vp, ID(Sat. ), gm, and rd and theoretical values for I D(Sat. ). Plot the IDS versus VDS characteristic and show pinch-off locus in the plot Plot both the experimental and theoretical curves for ID(Sat. ) versus νGS Determine gm and rd at νDS = 8 V Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs JFET IDS – VDS Curves Electronic Devices Laboratory mtinker@utdallas.

Low Frequency Characteristics of JFETs JFET IDS – VDS Curves Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs JFET IDS – VDS Curves and Pinch off Electronic

Low Frequency Characteristics of JFETs JFET IDS – VDS Curves and Pinch off Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110

Low Frequency Characteristics of JFETs Plots of gm and rd Versus VGS at VDS

Low Frequency Characteristics of JFETs Plots of gm and rd Versus VGS at VDS = 8. 0 V Electronic Devices Laboratory mtinker@utdallas. edu CE/EE 3110