ION BEAM ANALYSIS Participant Nataliya Paltseva Slovak Republic

ION BEAM ANALYSIS

• • • Participant: Nataliya Paltseva (Slovak Republic, Comenius University in Bratislava) Supervisor: Alexander P. Kobzev, Ph. D. Place of work: Frank Laboratory of Neutron Physics

RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS)

Kinematic factor

Differential scattering cross section

Height of the energy spectrum ΔE - the energy difference observed for ions scattered from the surface and from depth x; E 0, E 1 - incident and exit energies; ε - stopping cross section factor

RBS energy spectrum

Experimental conditions : Spectrum file Type of the beam ( atomic number ) Energy of the beam in [Me. V] Solid angle of detector [sr] Angles between target and beam [deg] IBM Cornell : 90. 00 Angle between detector and beam [deg] Detector resolution [ke. V] Integrator count Constant of integrator (In exp. form) Calibration Energy - Channel E = A*k + B A =. 0019406 B =. 0471190 : F. 142 : 2. 03 : . 0018200 : 25. 00 : 170. 00 : 15. 00 : 20000. 00 : . 3478 E+10 Depth Element Concentrations (at %) nm Ru Sr Fe Si O ---------------------------------------100. 8 19. 44 14. 37 1. 20. 00 64. 99 221. 2. 00. 79 34. 28 64. 93 623. 1. 00. 00 100. 00 10669. 3. 00. 00 100. 00

Particle Induced X-ray Emission (PIXE) The incident beam particles eject inner shell electrons from the target atoms which results in the emission of characteristic x-rays. Moseley's Law:

PIXE energy spectrum

RBS energy spectrum

Concentration [%] of elements in the sample obtained by using methods RBS and PIXE Sample N 7 N M A S C N O a g l i S 3 RBS PIXE 2 7 2 3, 3, 3, 5, 1 5 2 2 1 2 Ti RBS PIXE V Cl K a 1, 3 0, 0 0 0, 6 1 3 Mn Fe 0, 4 2 0, 0 2 2 1 C Cu Zn As 0, 0 1 4 1 Sr Zr 0, 0 2 5

The advantages and weakness of RBS: • • well suited for thin film analysis provides depth information without the requirements for destruction of the sample rapid analysis high sensitivity The advantages and weakness of PIXE: • capable to recognize each element heavier than C • suitable for trace element analysis • no depth information • only general information about concentration

Thank you for attention!