INCircuit Tester ESI2002 ESI2002 ST Windows Based High

IN-Circuit Tester ESI-2002 / ESI-2002 ST Windows Based High Speed IN-Circuit Tester

Features of ESI-2002 1) Windows based (Windows 2000) This in new In-Circuit Tester that been operated on Windows 2000. So it is easy to set up for networking with other PC or to utilize some application. 2) High speed inspection This new model ESI-2002 shortens inspection time about 40% than our previous model ‘ESI-202). 3) Exceptional Inspection accuracy By using “nonadjustable measurement system (the digital calibration)”, be achieved Improvement for absolute accuracy and repetitive accuracy. And the digital calibration achieved improvement for stabilization of fluctuation for discrete value by secular change and temperature change. 4) Include Total Kelvin measurement as standard equipment Sought-after optional function for our previous model (ESI-202) “Total Kelvin Measurement Function” had been include on ESI-2002 as standard equipment. ** Need relay card for this function. 5) Improved “Charge test” and “Auto discharge function”! Improved “Auto discharge function” for protect machine from remaining charge at capacitor. ( 16 points / group 127 points / group ) And also be improved power voltage for discharge to 10 V. ** Need discharge before inspection for be turned on electricity board. 6) Increased the number of measurement group The number of measurement group had been increased. ( 128 group available) So it will come in useful for inspection for cavity style board. 7) Increased the number of measurement step The number of measurement step is 16, 000 steps ( include IC test). Available to inspect integrated board. 8) Available to use our previous fixture The fixture size is same as our previous model (ESI-202), and the test program for ESI-202 can be used on ESI-2002. (Interactive ) 9) Available to upgrade from our previous model (ESI-202). It is available to upgrade from ESI-202. On this case, only changing the measurement card, LAN card and PC. The relay card is same as ESI-202. Available to choice from as follows models. Standard table top model Stand model In line model Press less model Model : ESI-2002 STA Model : ESI-2002 B

Delta Scan Test Delta Scan uses the pin protection diodes inside the digital device to detect The manufacturing fault of device. Frame Scan Test Frame Scan uses capacitive coupling to detect the manufacturing fault device. Cap Scan Test Cap Scan uses Frame Scan technology to detect the misorientation of polarized capacitor and avoid potential board Damege on power-up. **Delta Scan Frame Scan are patent of Teradyne Inc. , USA. High-Voltage Zener Diode Available to inspect between 40 V and 90 V. Function Unit By connecting with additional unit ESF-2002 (Option) can inspect as follows function test. And this unit has GPIB interface, so it is available to connect with other measuring unit. DC Voltage Frequency Time test Time difference Another Option Area Sensor Safety cover Protect operator from front side for ICT press. Protect operator from back side for ICT press. One touch fixture OK stamp Easy handling for changing fixture Can stamp OK stamp on OK board by air cylinder or solenoid.

ESI-2002 Specifications Standard Model : ESI-2002 Stand Model : ESI-2002 ST Press less type (1024 pin model) : ESI-2002 B 650 560 550 ** Specifications Subject to change without notice. Shindenshi Corp. , 3 -22 -20 Nozaki, Mitaka, Tokyo, Japan TEL 81 -422 -31 -5530 FAX 81 -422 -31 -2988 INTERNET HOMEPAGE http: //shindenshi. co. jp