Fintronic Fin Farm For further information please contact

Fintronic Fin. Farm™ For further information please contact: • Enables one engineer to manage many simultaneous simulations • Based on – Network of computers – Farming methodology – Farming tools • Farms have advantages over grid and platform computing • Typical farms can use between 10 and more than 1000 licenses Alternative System Concepts, Inc. 22 Haverhill Road P. O. Box 128 Windham, NH 03087 Tel: 603 437 2234 asc-info@ascinc. com www. ascinc. com or Fintronic USA, Inc. 1119 Chess Drive Foster City, CA 94404 Tel: 650 349 0108 info@fintronic. com www. fintronic. com Design Verification Method for Radiation Hardness Using Simulation Farms RADIATION DESTROYS CIRCUITS DEFECTIVE CIRCUITS KILL MISSIONS SEU faults lead to Soft errors Total dose leads to Hard errors Fintronic USA

Features • Cells are measured once and results are stored in IEEE standard • Monte Carlo technique is used to establish radiation susceptibility of complex ICs during simulation HDL DESIGN MODEL Radiation Susceptibility Cell Data HDL COMPILER and ELABORATOR Simulator Cell net info FAULT LIST COMPUTING FARM ALF COMPILER FAULTS GENERATOR ALF • Fast feedback to designers • Major cost reduction Radiation Characteristics ALF or XML COMPILER Assessment Results Confidence Level Calibration Methods • Fabricate all supported cells on tested chip • Use existing circuits for testing • Use an unhardened version of the circuit • Use transistor susceptibility based on measurements Flow Diagram of the Radiation Hardness Analyzer Benefits - radiation susceptibility failure of cells used in circuit and characteristics of radiation environment determine the injected faults - circuit portions that need not be rad hardened are verified, thus saving cost - accurately predict effects of hard and soft failures - simulation on farm of injected faults mimics possible behavior of circuit under given radiation environment - automatic result processing produces a report aimed at helping improve the design - IEEE Std. 1603™ ALF allows standardized test protocols and interfaces