Fig 1 RELATIONSHIP BETWEEN SOC AND THERMAL STARTING

Fig. 1 RELATIONSHIP BETWEEN SOC AND THERMAL STARTING TEMPERATURE

Fig. 2 RELATIONSHIP BETWEEN SOC AND CALORIFIC VALUE

FIG. 3 INTERNAL SHORT CIRCUIT(SIMULATION) CYLINDRICAL ：ＩＣＲ１８６５０ HIGHEST TEMPERATURE：３３６℃ SOC：５０％ AMBIENT TEMPERATURE：１００℃

FIG. 4 INTERNAL SHORT CIRCUIT (SIMULATION) CYLINDRICAL：ＩＣＲ１８６５０ SOC：７０％ HIGHEST TEMPERATURE：３８７℃ AMBIENT TEMPERATURE：１００℃

FIG. 5 INTERNAL SHORT CIRCUIT (SIMULATION) CYLINDRICAL：ＩＣＲ１８６５０ SOC：１００％ AMBIENT TEMPERATURE：１００℃

FIG. 6 HEAT SPREAD AFTER SHORT CIRCUIT（at 100℃） ALL BATTERIES BURNT DOWN DUE TO CHAIN REACTION 0. 1 s 0. 2 s 0. 3 s 0. 4 s 0. 5 s 0. 6 s 100 0. 7 s SOC 100% SOC 70% SOC 50% TEMPERATURE BECOMES OVER DECOMPOSING TEMTERATURE OF ACTIVE MATERIALS AT LIMITED AREA AT PLACES OF INTERNAL SHORT CIRCUIT TEMPERATURE BECOMES DOWN DUE TO HEAT SPREAD 400 0. 8 s

GRAPH 1. INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC：ＩＣＰ１０３４５０ AMBIENT TEMPERATURE：１００℃ LEGEND OF TEST RESULT ● ： HEAT GENERATED（NO THERMAL RUNAWAY） △ ： SMOKE OR BURST OCCURED DATA AT TEST ATTACHED CHRGE CONDITIONS TEST TEMP. TEST RESULTS VOLTAGE SOC HIGHEST TEMP. OF BATTERIES（℃） 4. 19 V 100% 100℃ △△△△△ △ △ 3. 82 V 50% 100℃ ○○○○○ 116 115 119 116 119

FIG. 7 INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC：ＩＣＰ１０３４５０ SOC：１００% AMBIENT TEMPERATURE：１００℃ Cell Temperature The burst occurred at the moment of short circuit Cell Voltage

FIG. 8 INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC：ＩＣＰ１０３４５０ SOC：５０% AMBIENT TEMPERATURE：１００℃ Cell Temperature Heat generation occurred by short circuit after reaching the highest temperature（116℃）, cell temperature fell gradually. Cell Voltage

FIG. 9 INTERNAL SHORT CIRCUIT TEST(CRUSH TEST） PICTURE SHOWN AFTER CRUSH PRISMATIC：ＩＣＰ１０３４５０ SOC：１００% AMBIENT TEMPERATURE：１００℃ BATTERY SIDE BATTERY TOP No. 1 No. 2 No. 3 No. 4 No. 5

FIG. 10 INTERNAL SHORT CIRCUIT TEST(CRUSH TEST） PICTURE SHOWN AFTER CRUSH PRISMATIC：ＩＣＰ１０３４５０ SOC：５０% AMBIENT TEMPERATURE：１００℃ BATTERY SIDE BATTERY TOP No. 1 No. 2 No. 3 No. 4 No. 5