ESD Stress Test Models Jos D Sancho NASA

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ESD Stress Test Models José D. Sancho NASA Workmanship Standards 1 12/7/2020

ESD Stress Test Models José D. Sancho NASA Workmanship Standards 1 12/7/2020

Introduction General Comments l What is an ESD Sensitivity Level? l How is it

Introduction General Comments l What is an ESD Sensitivity Level? l How is it obtained? l Why is it important to the user? l Why different test models? l How we can reduce ESD related failures l NASA Workmanship Standards 2 12/7/2020

Agenda l l l The human body model (HBM) The machine model (MM) The

Agenda l l l The human body model (HBM) The machine model (MM) The charge device model (CDM) – Robotic (Real) CDM (R-CDM) – Socketed CDM (SDM) l l Damage differences between models Transmission Line Pulse (TLP) stress testing Reasons for CDM/TLP current emphasis Questions NASA Workmanship Standards 3 12/7/2020

Overview ESD standard test models define the ESD sensitivity level of electronic parts. l

Overview ESD standard test models define the ESD sensitivity level of electronic parts. l Their Significance to the different sensitivity levels used in industry. l FA recognition of the model responsible for an ESD failure event. l ESD Models: (differences & interrelation) NASA Workmanship Standards HBM M M TLP CDM 4 12/7/2020

The Human Body Model (HBM) l Simulates an Electrostatic Discharge from the human body

The Human Body Model (HBM) l Simulates an Electrostatic Discharge from the human body to a device (e. g. electronic component). • Most commonly used model • Best understood by operators • Best controlled by Equipment and Training Courtesy of Botron Co. NASA Workmanship Standards 5 12/7/2020

HBM Test Circuit 100 Meg SW 1 1. 5 K SW 2 HV Supply

HBM Test Circuit 100 Meg SW 1 1. 5 K SW 2 HV Supply DUT 100 pf IPS IPR 500 Ω 10 K-10 Meg Courtesy of ESDA Basic HBM Test Circuit NASA Workmanship Standards 6 12/7/2020

HBM Waveforms. Older waveform ANSI/ESD STM 5. 1 -2001 Current Waveform through a shorting

HBM Waveforms. Older waveform ANSI/ESD STM 5. 1 -2001 Current Waveform through a shorting wire ANSI/ESD STM 5. 1 -2001 Stress Waveform Used for HBM ESD Testing NASA Workmanship Standards 7 12/7/2020

Typical HBM Generated Failures 100 X 2000 X Courtesy of JPL NASA Workmanship Standards

Typical HBM Generated Failures 100 X 2000 X Courtesy of JPL NASA Workmanship Standards Scott M. Hull NASA/GSFC 8 12/7/2020

The Machine Model (MM) l l l Originated in Japan Discharge from Equipment or

The Machine Model (MM) l l l Originated in Japan Discharge from Equipment or Small Tools to a Device Simulates some ESD events in Automatic Equipment Repetitive, faster and more severe than the HBM Mostly used in the design of Automatic Handling Equipment and ESD-safe tools NASA Workmanship Standards 9 12/7/2020

Original MM Circuit & Waveform 100 Meg 500 n. H SW 1 SW 2

Original MM Circuit & Waveform 100 Meg 500 n. H SW 1 SW 2 HV Supply NASA Workmanship Standards 200 pf 10 K 10 Meg DUT 10 12/7/2020

ESDA Machine Model Circuit 100 Meg SW 1 SW 2 HV Supply 200 pf

ESDA Machine Model Circuit 100 Meg SW 1 SW 2 HV Supply 200 pf NASA Workmanship Standards 10 K-10 Meg Ip. S DUT Short Ip. R 500 Ω 11 12/7/2020

ESDA MM Test Waveforms ANSI/ESD STM 5. 2 -1999 400 v discharge through a

ESDA MM Test Waveforms ANSI/ESD STM 5. 2 -1999 400 v discharge through a shorting wire NASA Workmanship Standards ANSI/ESD STM 5. 2 -1999 400 v discharge through a 500 Ω resistor 12 12/7/2020

Typical MM ESD Stress Failure Scott M. Hull NASA/GSFC NASA Workmanship Standards 13 12/7/2020

Typical MM ESD Stress Failure Scott M. Hull NASA/GSFC NASA Workmanship Standards 13 12/7/2020

The Charge Device Model (CDM) Simulates Electrostatic Charge transfer from a Device. l Two

The Charge Device Model (CDM) Simulates Electrostatic Charge transfer from a Device. l Two sub-models are used R-CDM & SDM l Test repeatability between Test-Sets has been a problem. l Per ESDA Statistics, 90% of all field failures are caused by CDM ESD events. l Failures are typically at the core of the Device l NASA Workmanship Standards 14 12/7/2020

Charge Device Model Circuits Device with Multiple Discharge Paths Device with One Point Discharge

Charge Device Model Circuits Device with Multiple Discharge Paths Device with One Point Discharge Sw 1 DUT Sw 1 Rd Rc DUT Rd 1 Ld Rc Ld 1 Rd 2 Ld 2 Rdn Ldn Cd Cd 1 Rc = Resistance to Ground. NASA Workmanship Standards Rd , L d , Cd = Cd 2 Cdn Resistance, Inductance & Capacitance In the Discharge Path. 15 12/7/2020

ESDA CDM Test Waveform ANSI/ESD STM 5. 3. 1 -1999 Waveform for the verification

ESDA CDM Test Waveform ANSI/ESD STM 5. 3. 1 -1999 Waveform for the verification Modules using a 3. 5 GHz BW NASA Workmanship Standards 16 12/7/2020

Typical CDM generated failures 4600 x 8600 x Courtesy of JPL NASA Workmanship Standards

Typical CDM generated failures 4600 x 8600 x Courtesy of JPL NASA Workmanship Standards Courtesy of JPL 17 12/7/2020

Typical CDM Generated Failure Courtesy of Frederick Felt GSFC Part Analysis Lab. ESD event

Typical CDM Generated Failure Courtesy of Frederick Felt GSFC Part Analysis Lab. ESD event (~1 KV) shown at arrow after parallel Polishing NASA Workmanship Standards 18 12/7/2020

Models Comparisons ESD Models ZD RC CD (pf) LD (μH) ΕS (μJ) 5τ (ηs)

Models Comparisons ESD Models ZD RC CD (pf) LD (μH) ΕS (μJ) 5τ (ηs) Pave (W) IPS (A) Vc = 200 V Typ. # Req # Typ # ½CV 2 5 Re. C Ε/τeff V/Re HBM 0 1500 100 0 2 750 3 0. 13 MM 55 2 200 5. 0 E-07 4 160 25 3. 5 CDM 42 25 15 1. 0 E-08 0. 3 5 30 3 ESD Models ZD RC CD LD ΕS in μJ 5τ in ηs Pave (W) IPS Vc = 1000 V Typ. # Req # Typ # ½CV 2 5 Re. C Ε/τeff V/Re HBM 0 1500 100 0 50 750 ~67 0. 67 MM 55 2 200 5. 0 E-07 100 160 625 17. 5 CDM 42 25 15 1. 0 E-08 7. 5 5 >750 15 Courtesy of ESDA NASA Workmanship Standards 19 12/7/2020

Transmission Line Pulse (TLP) Used By IC Designers since 1985 to evaluate ESD protection

Transmission Line Pulse (TLP) Used By IC Designers since 1985 to evaluate ESD protection schemes. l Simulates HBM with very short pulses. l Allows non-destructive & latch-up issues testing. l Provides better results on a controlled simulation of the SDM. l NASA Workmanship Standards 20 12/7/2020

TLP Design Methodologies Current Source l Time Domain Reflectometer l Time Domain Transmission l

TLP Design Methodologies Current Source l Time Domain Reflectometer l Time Domain Transmission l Time Domain Reflection and Transmission l NASA Workmanship Standards 21 12/7/2020

Current Source TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 22 12/7/2020

Current Source TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 22 12/7/2020

Time Domain Reflectometer TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 23

Time Domain Reflectometer TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 23 12/7/2020

Time Domain Transmission TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 24

Time Domain Transmission TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 24 12/7/2020

TDR&T TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 25 12/7/2020

TDR&T TLP ANSI/ESD SP 5. 5. 1 -2004 NASA Workmanship Standards 25 12/7/2020

Summary Models establish Benchmarks for ESD Sensitivity. l Different Models are used under different

Summary Models establish Benchmarks for ESD Sensitivity. l Different Models are used under different environments. l Models provide help to prevent and analyze ESD Failures l Please send feedback to: jsancho. 1@pop 300@nasa. gsfc. gov l NASA Workmanship Standards 26 12/7/2020

Where to Get More Information WEB searches under “ESD Models” l ESDA publications l

Where to Get More Information WEB searches under “ESD Models” l ESDA publications l Consulting services provide Advice on tough ESD problems and Solutions. l NASA Workmanship Standards 27 12/7/2020

References 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. ANSI/ESD STM

References 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. ANSI/ESD STM 5. 1 -2001 ESD Sensitivity Testing (HBM) ANSI/ESD STM 5. 2 -1999 ESD Sensitivity Testing (MM) ANSI/ESD STM 5. 3. 1 -1999 ESD Sensitivity Testing (CDM) ANSI/ESD SP 5. 2. 2 -2004 ESD Sensitivity Testing (SDM) ANSI/ESD SP 5. 5. 1 -2004 ESD Sensitivity Testing (TPL) Scott M. Hull, “ESD Failures in Thin-Film Resistors” NASA/Goddard Space Flight Center http: //qa. jpl. nasa. gov/esd/ http: //esdsystems. com/whitepapers/ http: //www. semiconfareast. com http: //www. ce-mag. com/archive/01/09/henry. html http: //www. ce-mag. com/cemag. com/archive/01/03/0103 CE_046. html NASA Workmanship Standards 28 12/7/2020