ECID vs Device ID Bill Eklow Cisco PresentationID

Moore’s Law – Transistor Count Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved.

Board Level Complexity Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential

Moore Complexity Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 4

Combined Line Card Chips@Cisco 2005 Presentation_ID © 2005 Cisco Systems, Inc. All rights reserved.

Why Chips Fail in System Supplier test escapes CM database Inaccuracy DPMO ICT & XRAY escapes CM diagnostic issues Presentation_ID ASIC design, marginality © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential Board design Issues Environmental 6

Returning Bad Components board fails functional test ICT retest * Pass Re-verified at debug X-ray retest Confirmed Pass BScan Remove failed ASIC and replace it Pass Confirmed ASIC fail to Supplier for retest X-ray retest Presentation_ID Pass © 2006 Cisco Systems, Inc. All rights reserved. ICT retest Cisco Confidential Pass Board to production 7

Root Causing Bad Components Focused ASIC RMA Supplier coverage ok? no Add more coverage fail Supplier FA yes Supplier retest pass = NTF Retest NTFs in system fail Diagnose fail pass • Test escape? Environmental fail? • Bad Diags? Good ASIC? Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential ATE Test escape? 8

Please – No More Moore!!!! § Device complexity/gate count/speed increasing § Component volumes increasing § Product Diversity increasing § Disconnect between Manufacturing and Engineering § Disconnect between CMs and Component Suppliers § Field Failures? ? ? § Result: Systemic Component Problems rarely get fixed Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 9

Collaboration in a Virtual Supply Chain EMS Partners Component Suppliers Quality Data Infrastructure System Integrator Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential Customer 10

What is e. CID? § e. CID is acronym for, “electronic chip ID” w 1234 – Initiated by IBM – Now a requirement for all new ASICs – Accessible via JTAG or CPU § In IBM case, 112 bit string contains the following information – Lot ID – Wafer ID – X / Y location of die in a wafer Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential For example, e. CID = {lot xyz, w 1234, 4, 2} 11

Wafer Map Analysis : feedback mech. Voltage Pass “Good” Neighbors Freq “Bad” Neighbors +

End-to-End Process Data Key Analysis Tools § ECID regionality analysis § Parametric characterization data for anomalies 0 5 10 15 20 25 30 Actions Taken § Tightened test limits reducing product failures Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 13

Benefits § Component Suppliers get data, not parts § Can apply component yield methodologies to system failures (Virtual Vertical Integration) § Process automation § Much finer granularity for traceability Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 14

Issues § Standardizing access and format of ECID data § Device ID? ? ?

Device ID Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 16

Challenges § Full ICT may go away § Functional diagnostics – Hard to scale – Need pilot project to test out § Need IT support – Escalate the priority § Current pilot – Not running for all ASIC/CM/Supplier Presentation_ID © 2006 Cisco Systems, Inc. All rights reserved. Cisco Confidential 17