ECE 477 RELIABILITY SAFETY ANALYSIS Team 5 my

ECE 477 RELIABILITY & SAFETY ANALYSIS Team 5 – my. ATM Xue Yuan Wong

OVERVIEW Automated Teller Machine (ATM) Use face recognition technology to verify identity � 4 -digit PIN Read/Write cash card via RFID Touchpad to navigate user menu Occupancy sensor to detect user

CRITICALITY LEVELS

COMPONENT ANALYSIS Microcontroller (Microchip PIC 18 F 24 J 11) � Complex architecture � Perform various tasks (eg: sample keypad buttons, occupancy sensor, RFID data, control modulation) Switching regulators (TI LM 2675 -3. 3/5. 0) � Handles large amount of current

COMPONENT ANALYSIS RFID read/write base station (Atmel U 2270 B) � Has 16 pins. Multiple modules inside the chip. Ø On-chip power supply circuit Ø Antenna driver circuit Ø Frequency generator Ø Signal processing circuit (modulation/demodulation) � Fast switching signals. Generate heat easily.

PIC 18 F 24 J 11 Microcontroller Paramaeter Description Value Comments C 1 Die complexity 0. 28 16 -bit MOS microprocessor πT Temperature coefficient 0. 98 Assume TJ < 85 °C C 2 Package failure rate 0. 013 28 pins non-hermetic SMT component πE Environment factor 2. 0 GF (ground fixed) πQ Quality factor 10 Commercial level πL Learning factor 1. 0 Started production in March 2011. Production > 2 years λP Failure rate / 106 hours 3. 004 1/ λP MTTF 332889 hours = 38 years

LM 2675 Switching Regulator Paramaeter Description Value Comments C 1 Die complexity 0. 01 MOS linear gate with approximately 1 to 100 transistors πT Temperature coefficient 16 Assume TJ < 100 °C C 2 Package failure rate 0. 0034 8 pins non-hermetic SMT component πE Environment factor 2. 0 GF (ground fixed) πQ Quality factor 10 Commercial level πL Learning factor 1. 0 Started production in 2004 Production > 2 years λP Failure rate / 106 hours 1. 668 1/ λP MTTF 599520 hours = 68 years

U 2270 B RFID Read/Write Base Station Paramaeter Description Value Comments C 1 Die complexity 0. 01 MOS linear gate with approximately 1 -100 transistors πT Temperature coefficient 16 Assume TJ < 100 °C C 2 Package failure rate 0. 0072 16 pins non-hermetic SMT component πE Environment factor 2. 0 GF (ground fixed) πQ Quality factor 10 Commercial level πL Learning factor 1. 0 Started production in 2005 Production > 2 years λP Failure rate / 106 hours 1. 744 1/ λP MTTF 573394 hours = 65 years

Section A - Power Supply Block

Section B - Microcontroller Block (1)

Section B - Microcontroller Block (2)

Section C – RFID Block

FMECA CHART Section A – Power Supply Block Failure No. Failure Mode A 1 A 2 Causes Effects Method Criticality of Detection VDD 1 = 0 V -Failure or of VDD 2 = 0 V switching regulator -L 1, L 2 opencircuit or shortcircuit -No keypad input -Fail to access RFID cash card -Cannot detect user Intel board watchdo g VDD 1 > 5 V or VDD 2 > 3. 3 V -Partial loss Intel of ATM board functionality watchdo g - Failure of switching regulator Low Medium Remarks

FMECA CHART Section B – Microcontroller Block Failure No. Failure Mode Causes Effects B 1 No keypad input is detected (RB 1 = 0 V, RB 2 = 0 V, RB 3 = 0 V) -Keypad buttons -Could not become less input PIN to sensitive authenticate user By Low observati on B 2 Microcontroll er UART becomes not responsive -Failure of MAX 3232 -C 4, C 5, C 6, C 7 open-circuit or short-circuit -Intel Mediu board m watchdo g Observat ion -Loss communicatio n between microcontroller and Intel Atom Board Method Critical Re of ity mar Detection ks

FMECA CHART Section B – Microcontroller Block Failure No. Failure Mode Causes Effects B 3 Pin “PIR” = 0 V -Fail to detect By Low user observati - ATM stays at on inactive mode Potential failure of occupancy sensor Method Critical Re of ity mar Detection ks

FMECA CHART Section C – RFID Block Failure No. Failure Mode Causes Effects Method Critical Re of ity mar Detection ks C 1 Pin CFE continuously receives 0 or 1 -Potential failure of voltage translator (MAX 3373) - Could not control modulation -Unable to read/update cash card By Low observati on C 2 Modulation frequency out of tolerance (f > 125 k. Hz or F < 125 k. Hz) -R 3 short-circuit or open circuit - Internal modulation circuitry issue -Cannot detect By Low cash card observati -Fail to on read/update cash card

FMECA CHART Section C – RFID Block Failure No. Failure Mode Causes C 3 Data rate out of tolerance (125 k. Hz / 32) Effects - Incorrect -Unable to register read RFID configuration cash card of RFID cash card - Potential failure of cash card Method of Detection Critical Remark ity s By observatio n Low

QUESTION