Device Fabrication Example Group 2 pn junction Diode
Device Fabrication Example Group: - 2
pn junction Diode Fabrication Start: � The starting point is a flat, damage-free , singlecrystal, Si wafer. � Common dopants are boron for P-type layers and phosphorus, antimony and Arsenic for N-type layers. � Assume the wafer is p-type, having been uniformly doped with boron during the formation of the crystal.
1. Oxidation: � The process of oxidation consists of growing a thin film of silicon dioxide on the surface of the silicon wafer. � It will serve as a diffusion barrier. �The oxide thickness must be comfortably greater than the projected masking thickness.
2. Lithography#1: � This process performed to open “diffusion” holes in the oxide that will eventually become the positions of the pn junction diodes.
3. Phosphorus Diffusion � After a proper clean-up the wafer is nest inserted into a phosphorus pre-deposition Furnace. � The formation of n+ -p junctions is surface regions not protected by the oxide. (The + in n+ is indicate a very high doping.
4. Metallization(sputter Al) � Evaporation of Al yields a thin metal film over the entire surface of the wafer due to connect the device to the ‘’outside world’’
5. Lithography #2: � It is performed to remove excess metal external to the area of the diffused junction.
� To produce commercial diodes, a diamond-edged saw would be used to cut the wafer into pieces containing a single device.
n-well process Fabrication Steps �Typically use p-type substrate for n. MOS transistors �Requires n-well for body of p. MOS transistors
Oxidation � Blank wafer covered with a layer of Si. O 2 using oxidation
Photoresist �Spin on photoresist ◦ Photoresist is a light-sensitive organic polymer ◦ Softens where exposed to light
Lithography �Expose mask photoresist through n-well
Etch �Etch the uncovered oxide using HF (Hydroflouric acid)
Strip Photoresist �Etch the remaining photoresist using a mixture of acids
n-well �n-well is formed using either diffusion or ion implantation
Strip Oxide �Strip off remaining oxide using HF. Subsequent steps use the same photolithography process
Polysilicon � Deposit thin layer of oxide. � Chemical Vapor Deposition (CVD) of silicon layer ◦ Forms many small crystals called polysilicon ◦ Heavily doped to be good conductor
Polysilicon Patterning �Use same lithography process to pattern polysilicon
Self-Aligned Process �Cover with oxide to define n diffusion regions
N-diffusion �Pattern oxide using n+ active mask to define n diffusion regions
N-diffusion cont. �Diffusion or ion implantation used to create n diffusion regions
N-diffusion cont. �Strip off the oxide to complete patterning step
P-Diffusion � Similar set of steps form p+ diffusion regions for p. MOS source and drain and substrate contact
Contacts � Cover chip with thick field oxide � Etch oxide where contact cuts are needed
Metallization � Sputter on aluminum over whole wafer � Remove excess metal leaving wires
Detailed Mask Views �Six ◦ ◦ ◦ masks n-well Polysilicon n+ diffusion p+ diffusion Contact Metal Fabrication and Layout Slid e 28
3 D Structure
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