Detector Assembly Design CoverBaffle 51 Pin Electrical Connector

Detector Assembly Design Cover/Baffle 51 Pin Electrical Connector SCA Attachment Feet Motherboard Cable Pedestal Cold Strap Interface Package designed for low thermal conduction to surrounding structure

Relative Spectral Response Comparisons Baseline wafer 9601 Contingency wafer 9581 Hanger queen wafer (SIRTF-like material)

Alternate Material Read Noise at 7. 1 K Measured by University of Rochester 10 e- (Fowler-8) ~50% lower noise than SIRTF/IRAC "The integration time was 25 sec for all Fowler sampled images. Please note that one box was in a region that gave consistently higher noise which is due to excess row-banding in the first 80 rows. There is an occasional second point with higher noise due to cosmic ray hits (which were not filtered out). Therefore, we feel it is valid to ignore the 1 -2 points outside the major groupings at each sampling. " Dr. Craig Mc. Murtry, University of Rochester

Standard Material Read Noise at 30 K Measured by University of Rochester 2 e- (Fowler-32) "Noise data were obtained using the box average method. The integration time was 100 seconds for all Fowler sampled images in these data. For the data at 30 K, the capacitance was measured to be 32. 1 f. F. " Dr. Craig Mc. Murtry, University of Rochester

Floorplan for Aquarius 1024 x 1024 Readout 8 or 32 outputs (selectable) • Bond pads on top and bottom of chip Column shift register – Multiple chips can be close-butted side by side • Row shift register structure: • Column shift register structure: – 16 or 64 outputs (selectable) • 8 or 32 outputs on each half of array Row shift register – Top half of array reads out top-to-bottom – Bottom half of array reads out bottom-to-top – Windowing reduces number of rows read for increased frame rate – Each output reads out a block of pixels • 16 output mode: – Each block is 128 columns wide x 512 rows tall • 64 output mode: – Each block is 32 columns wide x 512 rows tall Column shift register 8 or 32 outputs (selectable)