DelayFault Testing Tutorial Acknowledgement This presentation is adapted

Delay-Fault Testing Tutorial Acknowledgement: This presentation is adapted from Professor Janak Patel’s tutorial on the same topic available on the web at: http: //courses. ece. uiuc. edu/ece 543/docs/Delay. Fault_6_per_page. pdf

Outline • • • Common Fault Models (Review) Defects and Delay Faults Delay Fault Models Transition Faults Path Delay Faults – Robust Path Test – Non-robust Path Test Delay Fault Testing Tutorial 2

Common Fault Models Delay Fault Testing Tutorial 3

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Only if no other path delay is increased. Delay Fault Testing Tutorial 16

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Exercise • Consider the 4 -Nand implementation of the XOR gate in the previous slide. There are six I/O paths hence 12 path delay faults. For each of these faults, determine if it is robustly testable, only non-robustly testable or not testable (functionally redundant). Provide justification for your answers. Delay Fault Testing Tutorial 23

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Broadside is also called launch-off-capture test. Skewed-Load is also called launch-off-shift test. Delay Fault Testing Tutorial 26

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Timing for launch-off-capture Transition-delay fault testing IC: Initialization Clock LC: Launch Clock CC: Capture Clock SEN: Scan Enable This figure is borrowed from the. Delay paper, Ahmed al. , ITC-2005, Paper 11. 1 Fault Testinget Tutorial 29

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Timing for launch -off-shift Transition-delay fault testing IC: Initialization Clock LC: Launch Clock CC: Capture Clock SEN: Scan Enable Delay Fault Testing Tutorial This figure is borrowed from the paper, Ahmed et al. , ITC-2005, Paper 11. 1 31

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(See Prof. Patel’s website for details on Segment Test) Delay Fault Testing Tutorial 34

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