Component Test Flying Probe Tester APT 8400 Electronic

Component Test Flying Probe Tester APT 8400 Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Flying Probe Test Features: • 4 positionable test pins • Test for production defects (open, short, R, C, L values) Advantages: • No adapter costs • Test pads smaller in comparison to pin adapters (0. 2 mm compared with 0. 8 mm) • Short test program development time • Low test program development costs Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Net Test Method for reducing the test time and improving the fault coverage level Method for reducing test times Reduces the number of contacts and consequently the test time (in the standard test the neighbouring networks are contacted to detect SHORTs; in the network test the networks are usually only contacted once) Test time reduction: rate of 2. 5 to 7. improving the fault coverage level - complete control of the contacts - improved fault coverage level in relation to SHORTs (any 2 lines) - improved fault coverage level in relation to IC-OPEN if an internal impedance (R, C) is measurable Improved fault coverage level in relation to line interrupts Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Sample for Net(z)test application Standard-Test NET(z)Test ~ 1300 needle movements ~ 260 needle movements 100 Component test 1000 Short test Component test 60 NET(z)test 200 IC-Pin test 100 components, 200 nets with respective 5 neighbouring nets Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Fault Detection in the Network Test What faults are detected by the network test? 1) SHORTS between any two networks 2) Element faults (OPEN, incorrect value) for all elements connected to potential 3)IC-OPEN for IC pins if the 1 IC/network condition is fulfilled What faults are not detected by the network test? 1) IC-OPEN for IC pins if there is more than one input/output in the network. Improved fault coverage level with the network test 1) SHORTS between any two networks 2) IC-OPEN (detection of internal linear elements) Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Reducing the Test Time Test acceleration as a result of introducing the network test 1) All SHORT test stages no longer apply 2) Elements with a connection to the potential test within the framework of the network test 3) Minimum pin trajectory (optimum network sequence) 4) Effectiveness of pin movements with 4 pins (2 SHORT tests correspond to 3 network tests) Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Cost Comparison Net Test / Standard Test / ICT Test ICT-Test: Standard test: Progr. c. +Adapts c. : 15. 000 EUR Test costs/piece: 0, 42 EUR Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Net(z)test: Program costs. : 4. 000 EUR Program costs. : 6. 000 EUR Test costs/piece: 5 EUR Test costs/piece: 1 EUR

Cost Comparison ICT Test / Net Test (Fl. -Pr. ) / Net Test + Boundary Scan ICT-Test: Standard test: Progr. c. +Adap c. : 15. 000 EUR Test costs/piece: 0, 42 EUR Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology Net test: Program c. : 4. 000 EUR Program c. : 6. 000 EUR Test costs/piece: 5 EUR Test costs/piece: 1 EUR

Program development Fabmaster NET(z)Test soft ware UNICAM TAKAYA CA 8 -File Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology

Testing with Net(z)test perfect board defect board NET(z)Test program diagnosissoftware inside of NET(z)Test Electronic Design - Test Engineering Industrial Projects and Technical Services - ATD TD MCH 8 Information Technology