CMOS VLSI Digital Design CMOS VLSI 1 Overview





















































































- Slides: 85

CMOS VLSI Digital Design CMOS VLSI 1

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 2

Dopants q q q Silicon is a semiconductor Pure silicon has no free carriers and conducts poorly Adding dopants increases the conductivity Group V: extra electron (n-type) Group III: missing electron, called hole (p-type) Digital Design CMOS VLSI 3

n. MOS Operation q Body is commonly tied to ground (0 V) q When the gate is at a low voltage: – P-type body is at low voltage – Source-body and drain-body diodes are OFF – No current flows, transistor is OFF Digital Design CMOS VLSI 4

Transistors as Switches q We can view MOS transistors as electrically controlled switches q Voltage at gate controls path from source to drain Digital Design CMOS VLSI 5

CMOS Inverter A Y 0 1 Digital Design CMOS VLSI 6

Inverter Cross-section q Typically use p-type substrate for n. MOS transistors q Requires n-well for body of p. MOS transistors Digital Design CMOS VLSI 7

Inverter Mask Set q Transistors and wires are defined by masks q Cross-section taken along dashed line Digital Design CMOS VLSI 8

Fabrication Steps q Start with blank wafer q Build inverter from the bottom up q First step will be to form the n-well – Cover wafer with protective layer of Si. O 2 (oxide) – Remove layer where n-well should be built – Implant or diffuse n dopants into exposed wafer – Strip off Si. O 2 Digital Design CMOS VLSI 9

Oxidation q Grow Si. O 2 on top of Si wafer – 900 – 1200 C with H 2 O or O 2 in oxidation furnace Digital Design CMOS VLSI 10

Photoresist q Spin on photoresist – Photoresist is a light-sensitive organic polymer – Softens where exposed to light Digital Design CMOS VLSI 11

Lithography q Expose photoresist through n-well mask q Strip off exposed photoresist Digital Design CMOS VLSI 12

Etch q Etch oxide with hydrofluoric acid (HF) – Seeps through skin and eats bone; nasty stuff!!! q Only attacks oxide where resist has been exposed Digital Design CMOS VLSI 13

Strip Photoresist q Strip off remaining photoresist – Use mixture of acids called piranah etch q Necessary so resist doesn’t melt in next step Digital Design CMOS VLSI 14

n-well q n-well is formed with diffusion or ion implantation q Diffusion – Place wafer in furnace with arsenic gas – Heat until As atoms diffuse into exposed Si q Ion Implanatation – Blast wafer with beam of As ions – Ions blocked by Si. O 2, only enter exposed Si Digital Design CMOS VLSI 15

Simplified Design Rules q Conservative rules to get you started Digital Design CMOS VLSI 16

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 17

Complementary CMOS q Complementary CMOS logic gates – n. MOS pull-down network – p. MOS pull-up network – a. k. a. static CMOS Pull-up OFF Pull-up ON Pull-down OFF Z (float) 1 Pull-down ON X (crowbar) Digital Design 0 CMOS VLSI 18

Gate Layout q Layout can be very time consuming – Design gates to fit together nicely – Build a library of standard cells q Standard cell design methodology – VDD and GND should abut (standard height) – Adjacent gates should satisfy design rules – n. MOS at bottom and p. MOS at top – All gates include well and substrate contacts Digital Design CMOS VLSI 19

Example: NAND 3 q q q Horizontal N-diffusion and p-diffusion strips Vertical polysilicon gates Metal 1 VDD rail at top Metal 1 GND rail at bottom 32 l by 40 l Digital Design CMOS VLSI 20

I-V Characteristics q In Linear region, Ids depends on – How much charge is in the channel? – How fast is the charge moving? Digital Design CMOS VLSI 21

Channel Charge q MOS structure looks like parallel plate capacitor while operating in inversion – Gate – oxide – channel q Qchannel = CV Cox = eox / tox q C = Cg = eox. WL/tox = Cox. WL q V = Vgc – Vt = (Vgs – Vds/2) – Vt Digital Design CMOS VLSI 22

Carrier velocity q Charge is carried by eq Carrier velocity v proportional to lateral E-field between source and drain q v = m. E m called mobility q E = Vds/L q Time for carrier to cross channel: – t=L/v Digital Design CMOS VLSI 23

n. MOS Linear I-V q Now we know – How much charge Qchannel is in the channel – How much time t each carrier takes to cross Digital Design CMOS VLSI 24

Example q Example: a 0. 6 mm process from AMI semiconductor – tox = 100 Å – m = 350 cm 2/V*s – Vt = 0. 7 V q Plot Ids vs. Vds – Vgs = 0, 1, 2, 3, 4, 5 – Use W/L = 4/2 l Digital Design CMOS VLSI 25

Capacitance q Any two conductors separated by an insulator have capacitance q Gate to channel capacitor is very important – Creates channel charge necessary for operation q Source and drain have capacitance to body – Across reverse-biased diodes – Called diffusion capacitance because it is associated with source/drain diffusion Digital Design CMOS VLSI 26

Gate Capacitance q Approximate channel as connected to source q Cgs = eox. WL/tox = Cox. WL = Cpermicron. W q Cpermicron is typically about 2 f. F/mm Digital Design CMOS VLSI 27

Diffusion Capacitance q Csb, Cdb q Undesirable, called parasitic capacitance q Capacitance depends on area and perimeter – Use small diffusion nodes – Comparable to Cg for contacted diff – ½ Cg for uncontacted – Varies with process Digital Design CMOS VLSI 28

RC Delay Model q Use equivalent circuits for MOS transistors – Ideal switch + capacitance and ON resistance – Unit n. MOS has resistance R, capacitance C – Unit p. MOS has resistance 2 R, capacitance C q Capacitance proportional to width q Resistance inversely proportional to width Digital Design CMOS VLSI 29

Interconnect q Chips are mostly made of wires called interconnect – In stick diagram, wires set size – Transistors are little things under the wires – Many layers of wires q Wires are as important as transistors – Speed – Power – Noise q Alternating layers run orthogonally Digital Design CMOS VLSI 30

Wire Capacitance q Wire has capacitance per unit length – To neighbors – To layers above and below q Ctotal = Ctop + Cbot + 2 Cadj Digital Design CMOS VLSI 31

Lumped Element Models q Wires are a distributed system – Approximate with lumped element models q 3 -segment p-model is accurate to 3% in simulation q L-model needs 100 segments for same accuracy! q Use single segment p-model for Elmore delay Digital Design CMOS VLSI 32

Crosstalk q A capacitor does not like to change its voltage instantaneously. q A wire has high capacitance to its neighbor. – When the neighbor switches from 1 -> 0 or 0 ->1, the wire tends to switch too. – Called capacitive coupling or crosstalk. q Crosstalk effects – Noise on nonswitching wires – Increased delay on switching wires Digital Design CMOS VLSI 33

Coupling Waveforms q Simulated coupling for Cadj = Cvictim Digital Design CMOS VLSI 34

Noise Implications q So what if we have noise? q If the noise is less than the noise margin, nothing happens q Static CMOS logic will eventually settle to correct output even if disturbed by large noise spikes – But glitches cause extra delay – Also cause extra power from false transitions q Dynamic logic never recovers from glitches q Memories and other sensitive circuits also can produce the wrong answer Digital Design CMOS VLSI 35

Advanced Circuits q What makes a circuit fast? – I = C d. V/dt -> tpd (C/I) DV – low capacitance – high current – small swing q Logical effort is proportional to C/I q p. MOS are the enemy! – High capacitance for a given current q Can we take the p. MOS capacitance off the input? q Various circuit families try to do this… Digital Design CMOS VLSI 36

Pseudo-n. MOS q In the old days, n. MOS processes had no p. MOS – Instead, use pull-up transistor that is always ON q In CMOS, use a p. MOS that is always ON – Ratio issue – Make p. MOS about ¼ effective strength of pulldown network Digital Design CMOS VLSI 37

Dynamic Logic q Dynamic gates uses a clocked p. MOS pullup q Two modes: precharge and evaluate Digital Design CMOS VLSI 38

The Foot q What if pulldown network is ON during precharge? q Use series evaluation transistor to prevent fight. Digital Design CMOS VLSI 39

Monotonicity q Dynamic gates require monotonically rising inputs during evaluation – 0 -> 0 – 0 -> 1 – 1 -> 1 – But not 1 -> 0 Digital Design CMOS VLSI 40

Domino Gates q Follow dynamic stage with inverting static gate – Dynamic / static pair is called domino gate – Produces monotonic outputs Digital Design CMOS VLSI 41

Pass Transistor Circuits q Use pass transistors like switches to do logic q Inputs drive diffusion terminals as well as gates q CMOS + Transmission Gates: – 2 -input multiplexer – Gates should be restoring Digital Design CMOS VLSI 42

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 43

Sequencing q Combinational logic – output depends on current inputs q Sequential logic – output depends on current and previous inputs – Requires separating previous, current, future – Called state or tokens – Ex: FSM, pipeline Digital Design CMOS VLSI 44

Sequencing Overhead q Use flip-flops to delay fast tokens so they move through exactly one stage each cycle. q Inevitably adds some delay to the slow tokens q Makes circuit slower than just the logic delay – Called sequencing overhead q Some people call this clocking overhead – But it applies to asynchronous circuits too – Inevitable side effect of maintaining sequence Digital Design CMOS VLSI 45

Sequencing Elements q Latch: Level sensitive – a. k. a. transparent latch, D latch q Flip-flop: edge triggered – A. k. a. master-slave flip-flop, D register q Timing Diagrams – Transparent – Opaque – Edge-trigger Digital Design CMOS VLSI 46

Latch Design q Buffered output + No backdriving q Widely used in standard cells + Very robust (most important) - Rather large - Rather slow (1. 5 – 2 FO 4 delays) - High clock loading Digital Design CMOS VLSI 47

Sequencing Methods q Flip-flops q 2 -Phase Latches q Pulsed Latches Digital Design CMOS VLSI 48

Clocking Summarized q Flip-Flops: – Very easy to use, supported by all tools q 2 -Phase Transparent Latches: – Lots of skew tolerance and time borrowing q Pulsed Latches: – Fast, some skew tol & borrow, hold time risk Digital Design CMOS VLSI 49

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 50

Full Adder q Brute force implementation from eqns Digital Design CMOS VLSI 51

Carry-Skip Adder q Carry-ripple is slow through all N stages q Carry-skip allows carry to skip over groups of n bits – Decision based on n-bit propagate signal Digital Design CMOS VLSI 52

Tree Adder q If lookahead is good, lookahead across lookahead! – Recursive lookahead gives O(log N) delay q Many variations on tree adders – Brent-Kung: 2 N gates, 2 lg N depth – Sklansky: 0. 5 N lg N gates, lg N depth, high fanout – Kogge-Stone: N lg N gates, log N depth, 0. 5 N tracks Digital Design CMOS VLSI 53

Funnel Shifter q A funnel shifter can do all six types of shifts q Selects N-bit field Y from 2 N-bit input – Shift by k bits (0 k < N) Digital Design CMOS VLSI 54

Funnel Shifter Design 1 q N N-input multiplexers – Use 1 -of-N hot select signals for shift amount – n. MOS pass transistor design (Vt drops!) Digital Design CMOS VLSI 55

Funnel Shifter Design 2 q Log N stages of 2 -input muxes – No select decoding needed Digital Design CMOS VLSI 56

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 57

Memory Arrays Digital Design CMOS VLSI 58

Array Architecture q 2 n words of 2 m bits each q If n >> m, fold by 2 k into fewer rows of more columns q Good regularity – easy to design q Very high density if good cells are used Digital Design CMOS VLSI 59

6 T SRAM Cell q Cell size accounts for most of array size – Reduce cell size at expense of complexity q 6 T SRAM Cell – Used in most commercial chips – Data stored in cross-coupled inverters q Read: – Precharge bit, bit_b – Raise wordline q Write: – Drive data onto bit, bit_b – Raise wordline Digital Design CMOS VLSI 60

SRAM Sizing q High bitlines must not overpower inverters during reads q But low bitlines must write new value into cell Digital Design CMOS VLSI 61

Decoders q n: 2 n decoder consists of 2 n n-input AND gates – One needed for each row of memory – Build AND from NAND or NOR gates Static CMOS Digital Design Pseudo-n. MOS CMOS VLSI 62

Decoder Layout q Decoders must be pitch-matched to SRAM cell – Requires very skinny gates Digital Design CMOS VLSI 63

Sense Amplifiers q Bitlines have many cells attached – Ex: 32 -kbit SRAM has 256 rows x 128 cols – 128 cells on each bitline q tpd (C/I) DV – Even with shared diffusion contacts, 64 C of diffusion capacitance (big C) – Discharged slowly through small transistors (small I) q Sense amplifiers are triggered on small voltage swing (reduce DV) Digital Design CMOS VLSI 64

Queues q Queues allow data to be read and written at different rates. q Read and write each use their own clock, data q Queue indicates whether it is full or empty q Build with SRAM and read/write counters (pointers) Digital Design CMOS VLSI 65

CAMs q Extension of ordinary memory (e. g. SRAM) – Read and write memory as usual – Also match to see which words contain a key Digital Design CMOS VLSI 66

10 T CAM Cell q Add four match transistors to 6 T SRAM – 56 x 43 l unit cell Digital Design CMOS VLSI 67

CAM Cell Operation q Read and write like ordinary SRAM q For matching: – Leave wordline low – Precharge matchlines – Place key on bitlines – Matchlines evaluate q Miss line – Pseudo-n. MOS NOR of match lines – Goes high if no words match Digital Design CMOS VLSI 68

ROM Example q 4 -word x 6 -bit ROM – Represented with dot diagram – Dots indicate 1’s in ROM Word 0: 010101 Word 1: 011001 Word 2: 100101 Word 3: 101010 Looks like 6 4 -input pseudo-n. MOS NORs Digital Design CMOS VLSI 69

ROM Array Layout q Unit cell is 12 x 8 l (about 1/10 size of SRAM) Digital Design CMOS VLSI 70

Row Decoders q ROM row decoders must pitch-match with ROM – Only a single track per word! Digital Design CMOS VLSI 71

PLAs q A Programmable Logic Array performs any function in sum-of-products form. q Literals: inputs & complements q Products / Minterms: AND of literals q Outputs: OR of Minterms q Example: Full Adder Digital Design CMOS VLSI 72

PLA Schematic & Layout Digital Design CMOS VLSI 73

PLAs vs. ROMs q The OR plane of the PLA is like the ROM array q The AND plane of the PLA is like the ROM decoder q PLAs are more flexible than ROMs – No need to have 2 n rows for n inputs – Only generate the minterms that are needed – Take advantage of logic simplification Digital Design CMOS VLSI 74

Overview q q q Physical principles Combinational logic Sequential logic Datapath Memories Trends Digital Design CMOS VLSI 75

Ideal n. MOS I-V Plot q 180 nm TSMC process q Ideal Models – b = 155(W/L) m. A/V 2 – Vt = 0. 4 V – VDD = 1. 8 V Digital Design CMOS VLSI 76

Simulated n. MOS I-V Plot q 180 nm TSMC process q BSIM 3 v 3 SPICE models q What differs? – Less ON current – No square law – Current increases in saturation Digital Design CMOS VLSI 77

Velocity Saturation q We assumed carrier velocity is proportional to E-field – v = m. Elat = m. Vds/L q At high fields, this ceases to be true – Carriers scatter off atoms – Velocity reaches vsat • Electrons: 6 -10 x 106 cm/s • Holes: 4 -8 x 106 cm/s – Better model Digital Design CMOS VLSI 78

Channel Length Modulation q Reverse-biased p-n junctions form a depletion region – Region between n and p with no carriers – Width of depletion Ld region grows with reverse bias – Leff = L – Ld q Shorter Leff gives more current – Ids increases with Vds – Even in saturation Digital Design CMOS VLSI 79

Body Effect q Vt: gate voltage necessary to invert channel q Increases if source voltage increases because source is connected to the channel q Increase in Vt with Vs is called the body effect Digital Design CMOS VLSI 80

OFF Transistor Behavior q What about current in cutoff? q Simulated results q What differs? – Current doesn’t go to 0 in cutoff Digital Design CMOS VLSI 81

Leakage Sources q Subthreshold conduction – Transistors can’t abruptly turn ON or OFF q Junction leakage – Reverse-biased PN junction diode current q Gate leakage – Tunneling through ultrathin gate dielectric Subthreshold leakage: biggest source today Digital Design CMOS VLSI 82

DIBL q Drain-Induced Barrier Lowering – Drain voltage also affect Vt – High drain voltage causes subthreshold leakage to ____. Digital Design CMOS VLSI 83

Junction Leakage q Reverse-biased p-n junctions have some leakage q Is depends on doping levels – And area and perimeter of diffusion regions – Typically < 1 f. A/mm 2 Digital Design CMOS VLSI 84

Gate Leakage q Carriers may tunnel thorough very thin gate oxides q Predicted tunneling current (from [Song 01]) q Negligible for older processes q May soon be critically important Digital Design CMOS VLSI 85