capture of electrons in traps = trap = occupied trap photon pixel time pixel
capture & reemission of electrons ne= density of free electrons nt 0= total density of traps n 0= total density of occupied traps at t=0 nec= density of captured electrons pixel trap change in captured electrons cn= capture probability en=emission probability = -
solution T = temperature in K k = Boltzman constant A = temperature independent constant Eact= thermal activation energy for the emission of electrons = capture cross section vth= thermal velocity of electrons ne = free electron density
charge loss in Full Frame Mode pixel 1 1 2 readout: 22. 5 µs pixel 2 3 1 2 shift from pixel 2 to pixel 1: 700 ns modelling • collection of charge only under 1 • shift = store m times with t = (700 ns)/m m charge loss: m • nec 2 • main storage under 1 with t = 22. 5 µs charge loss: nec 1 3
charge loss in Timing Mode pixel 1 1 2 pixel 2 3 1 readout: 22. 5 µs 2 3 . . . . shift from 2 to 1: 700 ns . . compared to Full Frame: • collection of charge only under 1 • shift = store m times with t = (700 ns)/m m charge loss: m • nec 2 • main storage under 1 with t = 22. 5 µs but only every 10 pixel charge loss: : nec 1/10 pixel 10 1 2 3 shift from 10 to 9: 700 ns