BI Review on Radiation Development and Testing SPS
BI Review on Radiation Development and Testing SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013
Outline �SPS Multi Orbit POsition System (MOPOS) �System overview �Front-End Architecture �Rad-tol requirements, design and status �Possible impact and mitigation �Long-term radiation test planning and strategy BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 2
SPS Multi Orbit POsition System (MOPOS) TT 20 (SPS NA) BA 2 BA 3 �MOPOS Front-End � 216 BPMs in the tunnel �Exposed up to 100 Gy/y �Optical transmission BA 4 ECA 4 BA 1 BA 5 TT 66 (Hi. Rad. Mat) TT 40 BA 7 TI 2 (LHC) ECA 5 �MOPOS Read-Out �In surface buildings (BA 1. . . 6) TT 60 BA 6 TT 10 (PS) BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 TT 41 (CNGS) TI 8 (LHC) 3
MOPOS: Simplified Block Diagram y U L R Pickup D Serial ADC 10 MHz Log. Amps x Analogue Board Optical Link @ 2. 4 Gb/s FPGA Digital Board SPS Tunnel Front-End CHASSIS Radio Frequency Timing Distribution FPGA VME Interface Software Read-Out Board BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 4
Front-End Architecture BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 5
Analogue Board �Log-Amps �AD 8302 �ADL 5519 �MAX 2016 �ADC Drivers �ADA 4932 -2 �THS 4521 �Voltage regulators �LT 1963 AEQ �TL 1963 -KTT �LP 3875 -ADJ �TPS 7 A 4501 -KTT BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 6
PSI Irradiation Facilities (PIF) § § § Energy: 230 Me. V Flux: 1. 6 108 p/cm 2 s Fluence: 1. 874 1012 p/cm 2 Current: 4. 7 n. A Collimator: 58 mm (Si) Dose/run: 1 k. Gy - 105 rad/3. 5 h BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 7
PSI: Analogue Test Setup BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 8
Log. Amp ADL 5519 & ADC-Drivers BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 9
Analogue Components �Log. Amps �AD 8302: Analog Devices, Dual Log Amps �ADL 5519: Analog Devices, Dual Log Detector �MAX 2016: Maxim, Dual Log Detector �ADC Drivers �ADA 4932: Analog Devices, Differential ADC driver �THS 4521: Texas Inst. , Differential ADC driver ü These components have been qualified at PSI (TID 1 k. Gy) BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 10
Voltage Regulators BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 11
Analogue Components �Low Dropout Regulators �LT 1963 A: Linear Tech. , LDO Regulator (1/3 bad) �LP 3875: National Semi. , LDO Regulator (3/3 bad) �TL 1963 A: Texas Inst. , LDO Regulator �TPS 7 A 4501: Texas Inst. , LDO Regulator ü These components have been qualified at PSI (TID 1 k. Gy) BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 12
Optical Transceivers Test Board Commercial SFP Modules �Double-fiber SFP �FTTX Technology: FT 3 A 05 D �Single-fiber, bidirectional �Ligent: LTE 5350 -BC and LTE 3550 -BC �Lightron: WSP 24 -313 LC-I 5 A and WSP 24 -513 LC-I 3 A �Source Photonics: SPL-35 -GB-CDFM and SPL-53 -GB-CDFM �Yamasaki: 541315 L-15 B and 541315 L-15 Y BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 13
PSI Test Setup �Energy: 230 Me. V; Current: 2 n. A (~3. 5 rad/s) or 3 n. A (~6 rad/s); Collimator: 58 mm (Si) �TID goal: 1 k. Gy - 105 rad/component �Measurements every second: � Communication rate: 1. 25 Gb/s � 32 -bit word sent from the controller board (FPGA, Spartan 6) � Electrical loopback on the SFP Board � Cross-check between sent and received 32 -bit word � 2 SFP modules tested in parallel � For each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 14
Measurements – Best SFP Parts BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 15
SFP Test Results Summary �Ligent and Yamasaki components are very sensitive to the radiation level @ PIF �Source-Photonics components are more resistant but with many error bursts �FTTX and Lightron components behave much better but still generate many error bursts ØFor the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERN TESTS to be done with long transmission fibres (up to 1. 5 km) BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 16
CERN VTRx Radiation Specs Tolerance Level Dose and fluence (20 Mev neutron equivalent) Calorimeter 10 k. Gy 5 x 1014 n/cm 2 Tracker 500 k. Gy 6 x 1015 n/cm 2 Versatile Link Technical Specification, rev. 2 [J. Troska et al. ] BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 17
Short-Term Strategy �Current Front-End Digital PCB (vers. 1) �Analog Devices Octal 14 -bit ADC: AD 9252 �Xilinx Spartan 6 FPGA (Triplication, Hamming Code Correction…) �CERN VTRX Optical Transceiver �Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software) BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 18
Long-Term Strategy: Radiation Tests for ADC & Digital Parts �Beam Tests Conditions: equivalent to PSI Test Beams (230 Me. V; TID: 1 k. Gy) �In our section there is no manpower available in 2014 BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 19
Analogue/Digital Converters � 40… 65 Msps – LVDS Serial ADC �AD 9252: Analog Devices Octal 14 -bit �AD 9259: Analog Devices Quad 14 -bit �LTM 9009: Linear Tech. Octal 14 -bit �LTC 2171: Linear Tech. Quad 14 -bit �ADS 5294: Texas Inst. Octal 14 -bit �ADS 6442: Texas Inst. Quad 14 -bit BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 20
ADC Radiation Tests (H. Takai/BNL) TWEPP 2013 BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 21
Digital Components �Low Voltage and LVDS Buffers � 74 VCX 162244: Fairchild 16 -bit Buffer/Line Driver � 74 ALVCH 162244: Texas 16 -bit Buffer/Line Driver � 74 VMEH 22501: Texas 8 -bit Bus Transceiver �FIN 1108: Fairchild 8 -port LVDS Repeater BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 22
Digital Components: FPGA �SERDES integrated – SRAM technology �Xilinx SPARTAN 6 (currently used) � Test of the first board prototype: SPS – 2014 �Altera Stratix V � Cycling Redundancy Check of FPGA configuration � Possibility to get the corresponding ASIC �External SERDES FPGA + GBT project �SRAM – if failures are mostly related to SERDES �Antifuse – Microsemi Axcelerator AX 2000 �Flash RAM – for SRAM configuration �M 25 P 128 – Numonyx BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 23
THANK YOU FOR YOUR ATTENTION! BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 24
Spare Slides: PSI Radiation Tests BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 25
PSI: SFP Radiation Setup BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 26
SFP Tests: FTTX FT 3 A 05 D BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 27
SFP Tests: Lightron I 3 A BI Review on Radiation Development and Testing - J. L. Gonzalez - 22/11/2013 28
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