8 IEC TC 110 WG 2 Meeting Otsu

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【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC TC 110 WG 2 Meeting •

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC TC 110 WG 2 Meeting • 장소 : Otsu Prince Hotel, Otsu, Japan • 일시 : 2006. 12. 3 ~ 5 (09: 00~17: 30) • 참석자 : 총 18 명 (한국-4, 일본-9, 중국-1, 미국-1, 네델란드-2) Country Member Korea 김일호 대표 (LMS) : Project Leader (IEC 62341 -1 -1) 이종서 책임 (삼성전자) : Project Leader (IEC 62341 -1 -1) 조미령 박사 (조명기술연구소) 강호길 선임 (LG Philips LCD) 최정현 과장(EDIRAK) Japan Mr. Katsumi Ishiguro (Sharp) WG Convenor Mr. Mitsutaka Morimoto (JEITA) Mr. Yuji Yoda (Otsuka Electonics) Mr. Takeshi Nakamura (Sanyo/Epson) Ms. Yoshihiko Shibahara (Fujifilm) Mr. Shinsuke Katoh (Sharp) Mr. Yozo Narutaki (Sharp) Mr. Haruo Okamura (Corning) Mr. Johan Bergquist (Nokia) China Mr. Liu Weidong (Hisense Electric) USA Mr. James E. Matthews (Corning) Netherlands Mr. Alex Henzen (i. Rex) Mr. Kees Teunissen (Philips) 1

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 회의일정 1. 개회, 멤버 소개, 회의 일정

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 회의일정 1. 개회, 멤버 소개, 회의 일정 리뷰 2. 지난 회의록 검토 : 김일호 3. • 부산 회의 (2006. 3. 13 – 15) • 샌프란시스코 회의 (2006. 6. 5) • 도쿄 회의 (2006. 10. 20) 현재 작업중인 문건 검토 • 61747 -5 -2 Visual Inspection of Active Matrix Liquid Crystal Displays • 61747 -6 -2 Measuring methods for liquid crystal displays modules – Reflective type • 61747 -6 -3 Motion Artifact Measurement of Active Matrix Liquid Crystal Displays Modules • 61747 -5 -3 Glass strength and reliability • 기타 문건 (61747 -6, 61747 -2 -1) 4. 다음 회의 일정 확인 5. 폐회 2

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 Documents List Agenda No. Otsu  -No. 1, 3

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 Documents List Agenda No. Otsu  -No. 1, 3 OTSU -0 110/WG 2(Otsu/Convenor)0 Document No. List for TC 110/WG 2 Otsu meeting (’ 06/12/3 to 5) 2 OTSU -1 110/WG 2(Otsu/Convenor)1 TC 110/WG 2 Membership List (from IEC Home Page) 3 OTSU -2 110/WG 2(Otsu /Convenor)2 Draft agenda for the 27 th meeting of TC 110/WG 2 to be held in Otsu 4 OTSU -3 110/WG 2(Otsu /Convenor)3 Unconfirmed Minutes of the meeting of TC 110/WG 2 held in Pusan OTSU -4 110/WG 2(Otsu/Henzen)1 Unconfirmed minutes of TC 110/WG 2 Ad-hoc meeting held in San Francisco, USA OTSU -5 110/WG 2(Otsu/Morimoto)1 Unconfirmed minutes of TC 110/WG 2 Ad-hoc meeting held in Tokyo, Japan OTSU -6 110/102/PW TC 110 Programme of Work of the Committee 5 Document No. or Status * Red : Not available yet OTSU -7 6 -(1) Title of Document TC 110/WG 2 Programme of Work OTSU -8 110/75/CD OTSU -9 110/87/CC Compilation of Comments on 110/75/CD OTSU -10 110/WG 2(Otsu/I. H. Kim)1 Draft for 2 nd CD 6 -(2) OTSU -11 110/WG 2(Otsu/Henzen)2 6 -(3) OTSU -12 110/86/CD OTSU -13 110/100/CC OTSU -14 110/85/NP OTSU -15 110/103/RVN OTSU -16 110/89/RVD IEC 61747 -3, Ed. 2: Liquid crystal display devices -Part 3: Liquid crystal display (LCD) cells - Sectional specification Result of voting on 110/82/FDIS OTSU -17 110/94/RVD IEC 61747 -3 -1, Ed. 2: Liquid crystal display devices -Part 3 -1: Liquid crystal display (LCD) cells - Blank detail specification Result of voting on 110/88/FDIS OTSU -18 110/104/INF 6 -(4) 6 -(5) IEC 61747 -5 -2: Liquid crystal display devices -Part 5 -2: Visual Inspection of Active Matrix Liquid Crystal Display Modules, 1 st CD IEC 61747 -6 -2: Liquid crystal display devices -Part 6 -2: Measuring methods for liquid crystal display modules – Reflective type Latest version IEC 61747 -6 -3: Liquid crystal display devices -Part 6 -3: Motion Artifact Measurement of Active Matrix Liquid Crystal Display Modules, 1 st CD Compilation of Comments on 110/86/CD (Future IEC 61747 -5 -3 Ed. 1. 0) Liquid crystal display devices -Part 5 -3: Glass strength and reliability Results of Voting on 110/85/NP TC 110 publications and maintenance programme to be discussed at the meeting in Otsu 3

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -6 -2 Ed. 1. 0

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -6 -2 Ed. 1. 0 – Mr. Henzen • 110/41/NP (2005 -01 -21), 110/54/RVN (2005 -05 -20) • Liquid crystal display devices – Part 6 -2 : Measuring methods for liquid crystal displays modules – Reflective type • • 작성한 규격안에 대하여 논의 – Green : (sub) clause passed last review without comment (frozen) – Yellow : (sub) clause was edited since last meeting. No major change required – Blue : Major update or change required since last meeting – Purple : Addition required, but postponed to next revision Stage : NP 승인됨 5

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -6 -3 Ed. 1. 0

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -6 -3 Ed. 1. 0 - 이종서 • 110/86/CD (2006 -06 -02), 110/100/CC (2006 -11 -03) • Liquid crystal display devices – Part 6 -3 : Motion Artifact Measurement of Active Matrix Liquid Crystal Displays Modules • 전세계에서 코멘트한 104개 수정의견에 대하여 논의 • 규격의 적용 범위 재확인 • – TFT LCD Hold type – TFT LCD In pulse type Stage : 2007년 1월말까지 2 nd CD 발행 6

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -5 -3 Ed. 1. 0

【 제 8회 평판디스플레이 표준화기반구축사업 워크샵 】 IEC 61747 -5 -3 Ed. 1. 0 – Mr. Matthews • 110/85/NP (2006 -05 -26), 110/103/RVN (2006 -11 -10) • Liquid crystal display devices – Part 5 -3 : Glass strength and reliability • 전세계에서 코멘트한 24개 수정의견에 대하여 논의 • Stage : CDV 발행 7