3 D ptype detector TCT EdgeTCT scans Nonirradiated

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3 D p-type detector TCT, Edge-TCT scans Non-irradiated, 5 x 1015 cm-2

3 D p-type detector TCT, Edge-TCT scans Non-irradiated, 5 x 1015 cm-2

Sample • • Thickness: ca. 240 um Column diameter: 10 -12 um Strip pitch

Sample • • Thickness: ca. 240 um Column diameter: 10 -12 um Strip pitch (between the columns of the same type): 80 um Columns arranged in a square, columns of the same type at the corners with the opposite sign column at the centre. Columns etched from opposite sides. Do not pass through full thickness (ca. 15 um shorter than the thickness) Strips: Al, 30 um wide =>52 um gap P-stop ring around each of the n-type readout columns, and a common p-stop that surrounds the sensor area.

TCT scan @60 V, non-irradiated

TCT scan @60 V, non-irradiated

TCT scan non-irradiated, 0 -20 V

TCT scan non-irradiated, 0 -20 V

TCT scan non-irradiated, 20 -60 V

TCT scan non-irradiated, 20 -60 V

TCT scan, 5 x 1015 cm-2

TCT scan, 5 x 1015 cm-2

TCT scan, 5 x 1015 cm-2 0 -50 V in steps of 5 V

TCT scan, 5 x 1015 cm-2 0 -50 V in steps of 5 V

TCT scan, 5 x 1015 cm-2 60 -200 V in steps of 20 V

TCT scan, 5 x 1015 cm-2 60 -200 V in steps of 20 V

TCT scan, 5 x 1015 cm-2 220 -400 V in steps of 20 V

TCT scan, 5 x 1015 cm-2 220 -400 V in steps of 20 V

Annealing Effects – 20 mins 0 V - 400 V in steps of 50

Annealing Effects – 20 mins 0 V - 400 V in steps of 50 V

Annealing Effects – 40 mins 0 V - 400 V in steps of 50

Annealing Effects – 40 mins 0 V - 400 V in steps of 50 V

Annealing Effects – 40 mins

Annealing Effects – 40 mins

Annealing Effects – 100 mins 0 V - 400 V in steps of 50

Annealing Effects – 100 mins 0 V - 400 V in steps of 50 V

Annealing Effects – 300 mins 0 V - 400 V in steps of 50

Annealing Effects – 300 mins 0 V - 400 V in steps of 50 V

Annealing Effects – 600 mins 0 V - 400 V in steps of 50

Annealing Effects – 600 mins 0 V - 400 V in steps of 50 V

Annealing Effects – 600 mins @300 V @200 V @100 V Additional Studies

Annealing Effects – 600 mins @300 V @200 V @100 V Additional Studies

Edge-TCT scan, non-irradiated

Edge-TCT scan, non-irradiated

Edge-TCT scan, non-irradiated 0 -10 V, in steps of 1 V

Edge-TCT scan, non-irradiated 0 -10 V, in steps of 1 V